Separation Pattern Layout for Bridge-Free Semiconductor Interconnects

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Solution Overview

Problem

As design rules for semiconductor devices decrease, unwanted bridges can occur between conductive patterns due to the shrinking spaces, leading to manufacturing challenges in integrated circuit devices.

Innovation Solution

A method involving the formation of an intermediate structure layer with conductive pillars, a separation layer, and a separation pattern to create holes and trenches, followed by filling these patterns with conductive materials to prevent bridging between conductive pillars, using techniques like EUV lithography and chemical mechanical polishing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If spaces between conductive patterns are decreased to meet smaller design rules, then integration density is improved, but unwanted bridges occur between conductive patterns

Engineering Contradiction:
Improveintegration densityVSAvoidbridging defect
Core Design Contradiction:
Area of moving objectVSReliability

Solution Approach 1:

The patent introduces separation patterns that divide and isolate conductive patterns from each other. These separation patterns include holes exposing portions of first conductive pillars and trenches exposing portions of second conductive pillars, creating physical segmentation that prevents unwanted bridging while maintaining small design rules

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses a separation layer as an intermediary material between conductive patterns. This separation layer, when selectively removed to form separation patterns, provides controlled isolation between conductive elements, preventing direct contact and potential bridging while allowing necessary electrical connections through the exposed portions

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If separation patterns with holes and trenches are formed to prevent bridging, then reliability is improved, but manufacturing process complexity increases

Engineering Contradiction:
Improvebridging preventionVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The separation layer is formed in advance before the final conductive pattern formation. This preliminary action of creating the separation layer with predetermined hole and trench patterns allows for controlled isolation to be established before subsequent manufacturing steps, simplifying the overall process by pre-establishing the isolation structure

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent combines multiple functions into the separation patterns: they provide bridging prevention, define exposure areas for conductive pillars, create trenches for isolation, and serve as a template for subsequent conductive material deposition. This merging of multiple functions into a single structure reduces the number of separate process steps needed

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20240420999A1Methods of manufacturing semiconductor devices including separation patterns
Publication Date: 2024.12.19 SK HYNIX INC
  • US20240420999A1 patent drawing
  • US20240420999A1 patent drawing
  • US20240420999A1 patent drawing

AI summary

There is disclosed a method of manufacturing a semiconductor device including a separation pattern. An intermediate structure layer including first conductive pillars and second conductive pillars is formed over a semiconductor substrate. A separation layer is formed. Some portions of the separation layer is selectively removed to form a separation pattern, and third conductive patterns filling holes of the separation pattern and fourth conductive patterns filling trenches of the separation pattern are formed.