Sequential Array X-ray Diffractors for Spectral Multiplexing
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Solution Overview
Problem
Conventional x-ray wavelength dispersive spectrometers (WDSs) have limited analysis speeds and throughput due to the absorption of x-rays outside a narrow energy bandwidth, resulting in loss of spectral information and reduced data collection efficiency in applications like SEM spectroscopy, XRF analysis, and XAS.
Innovation Solution
The implementation of a sequential array wavelength dispersive spectrometer (SA-WDS) with multiple crystals configured sequentially along an x-ray propagation direction, where at least one upstream crystal transmits more than 2% of received x-rays to a downstream crystal, allowing simultaneous data acquisition across different x-ray energies using multiple detectors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional WDS uses a single diffractor to analyze x-rays, then high energy resolution is achieved, but data collection speed and throughput are limited
Solution Approach 1:
The patent divides the x-ray spectral analysis function into multiple segments by using several diffractors (first diffractor, second diffractor, etc.) arranged in sequence. Each diffractor is responsible for diffracting a specific spectral band to a corresponding detector, enabling simultaneous analysis of multiple energy ranges and thus increasing data collection speed while maintaining the high resolution advantage of individual diffractors.
Solution Approach 2:
The patent transitions from a single-energy-at-a-time analysis approach to a multi-energy-simultaneous analysis approach by adding the dimension of multiple diffractors operating in parallel. This allows the system to process multiple spectral bands concurrently, effectively increasing throughput without compromising the energy resolution provided by each individual diffractor-detector pair.
2Measurement precision
If a conventional WDS uses a single diffractor with narrow bandwidth, then high spectral resolution is achieved, but spectral information outside the narrow bandwidth is lost
Solution Approach 1:
The patent segments the broad x-ray spectrum into multiple spectral bands, with each diffractor-detecter pair responsible for a specific band. This segmentation allows the system to maintain high spectral resolution within each band while collectively covering a much wider energy range, thereby preventing information loss that would occur with a single narrow-bandwidth diffractor.
Solution Approach 2:
The patent creates a multi-functional system where multiple diffractors work together to analyze different portions of the x-ray spectrum simultaneously. This universal approach enables the system to handle diverse spectral information across wide energy bandwidths while maintaining the high resolution capability needed for precise spectral analysis.
3Measurement precision
If a conventional WDS analyzes one energy at a time, then high measurement precision is achieved, but analysis time increases
Solution Approach 1:
The patent implements continuous spectral analysis by having multiple detectors simultaneously record diffracted x-rays from multiple spectral bands. This eliminates the sequential measurement process of conventional WDS, allowing continuous collection of spectral data across wide energy ranges without the time loss associated with stepping through different energy ranges one at a time.
Solution Approach 2:
By segmenting the spectral analysis into parallel channels (multiple diffractor-detector pairs), the system can measure multiple energy ranges simultaneously, thereby reducing the total analysis time while maintaining the precision of individual measurements through the use of high-quality diffractors in each channel.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration significantly speeds up data collection by multiplexing the data acquisition process, reducing spectral interference, and increasing throughput compared to single-energy-at-a-time WDS instruments, enabling efficient use of x-rays across wider energy bandwidths.
Implementation Method 1
a diffractor comprising a crystal or a synthetic multilayer, the diffractor configured to disperse incident x-rays according to the Bragg law: 2*d*sin(θ)=n*λ
Data Source
AI summary
An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.