Soft Error Rate Calculation Using Building Radiation Attenuation

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Solution Overview

Problem

The increasing miniaturization and high integration of semiconductor devices lead to a rise in neutron soft errors, causing intermittent failures in electronic devices, particularly in data centers, where the cost and power consumption of redundant methods to mitigate these errors are high.

Innovation Solution

A soft-error-rate calculating device that calculates the soft error rate by using building and facility data to model the attenuation of radiation, providing a low soft error rate and reducing costs and power consumption by optimizing the placement and design of electronic devices within a data center.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If redundant methods are used to mitigate soft errors, then reliability is improved, but cost and power consumption increase

Engineering Contradiction:
ImprovereliabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The invention changes the parameter approach from binary redundancy (on/off) to continuous optimization by calculating specific soft error rates for different facility arrangements. This allows finding the optimal balance between reliability and power consumption by selecting arrangements that achieve adequate protection without excessive redundancy

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention performs preliminary calculation of soft error rates during the facility arrangement design phase, before actual deployment. This allows optimizing the arrangement to achieve necessary reliability levels without over-engineering, thereby reducing unnecessary power consumption from redundant systems

Inventive Principle:
Principle #10Preliminary action

2Reliability

If redundant methods are used to mitigate soft errors, then reliability is improved, but cost increases

Engineering Contradiction:
ImprovereliabilityVSAvoidcost
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The invention transforms the approach from fixed redundancy configurations to dynamic optimization based on calculated soft error rates. By evaluating specific error rates for different arrangements, the system identifies cost-effective solutions that achieve required reliability without excessive redundant infrastructure

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention performs preliminary soft error rate calculations during the planning stage, enabling cost optimization before deployment. This allows selecting facility arrangements that meet reliability requirements at minimal cost, avoiding unnecessary expenditure on redundant systems

Inventive Principle:
Principle #10Preliminary action

3Device complexity

If simple aggregation of soft error rates is used, then calculation simplicity is improved, but measurement precision deteriorates

Engineering Contradiction:
Improvecalculation simplicityVSAvoidsoft error rate accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The invention applies local quality by calculating soft error rates specifically for each facility's actual position and environment rather than using a uniform aggregation approach. This considers local factors such as building structure, facility location, and radiation exposure variations, providing more accurate results tailored to each specific context

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures high reliability in electronic devices and data centers by accurately calculating and mitigating neutron soft errors, thereby reducing costs and power consumption through optimized device placement and design.

Implementation Method 1

a model calculating unit that uses the building data and the facility data and calculates a model including an attenuation index value representing a degree of attenuation of radiation entering the building attenuated by the structural object of the building

Methodology Applied
Scientific EffectRadiation attenuation: Absorption (EM radiation)

Data Source

PatentUS9645871B2Soft-error-rate calculating device
Publication Date: 2017.05.09 HITACHI LTD
  • US9645871B2 patent drawing
  • US9645871B2 patent drawing
  • US9645871B2 patent drawing

AI summary

For a soft error of an electronic device, a technique capable of ensuring high reliability because of a low soft error rate (SER) is provided. By using building data including information of a structural object of a building and facility data including information of a plurality of facilities including an electronic device arranged in the building, a SER calculating device calculates a model including an attenuation index value representing a degree of attenuation of radiation entering the building attenuated by the structural object of the building until the radiation reaches a position of the facility arranged in the building, calculates a SER at each position of the facility arranged in the building by using the model including the attenuation index value, and outputs information including the SER at each position of the facility.