SERDES Memory Read Control Circuit with Dynamic Delay
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Solution Overview
Problem
Conventional SERDES type semiconductor memory apparatuses face challenges in maintaining operational efficiency and margin due to fixed time intervals for write/read operations, which are not adaptable to varying operational frequencies, leading to potential malfunctions during high-frequency operations and inefficiencies at low frequencies.
Innovation Solution
A control circuit for read operations in SERDES type semiconductor memory apparatuses is introduced, featuring a first and second line driver and delay units that generate delay signals synchronized with a clock, allowing for adjustable data output intervals based on operational frequency, ensuring data transmission alignment and operational margin.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If a fixed time interval is used for write/read operations in SERDES type semiconductor memory apparatus, then high-frequency operation can be achieved, but the apparatus cannot adapt to varying operational frequencies and always operates with predetermined minimum margin
Solution Approach 1:
The patent applies dynamics by making the time interval between column selection signals adjustable rather than fixed. The control circuit dynamically changes the time interval based on the operational frequency of the semiconductor memory apparatus, allowing the system to adapt to different operating conditions while maintaining optimal performance margins.
Solution Approach 2:
The patent changes the parameter of time interval between column selection signals from a fixed value to a variable value that can be adjusted according to operational frequency. This parameter change enables the apparatus to operate efficiently across different frequency ranges by optimizing the time interval for each operating condition.
2Reliability
If the time interval between column selection signals is fixed for high-frequency operation, then data transmission can be synchronized, but the apparatus operates with predetermined minimum margin and cannot efficiently handle low-frequency operations
Solution Approach 1:
The control circuit dynamically adjusts the time interval between column selection signals based on the actual operational frequency, maintaining reliable data transmission synchronization while optimizing productivity for each operating condition. This dynamic adjustment ensures the apparatus operates with appropriate margins regardless of frequency.
Solution Approach 2:
The patent implements feedback by having the control circuit detect the operational frequency of the semiconductor memory apparatus and adjust the time interval between column selection signals accordingly. This feedback mechanism ensures reliable operation across varying frequencies by continuously optimizing the time interval based on actual operating conditions.
3Stability of the object's composition
If column selection signals are generated without considering operational speed, then the apparatus can maintain fixed timing, but it cannot adapt to different operational speeds leading to potential malfunctions
Solution Approach 1:
The patent transforms the fixed timing system into a dynamic one where the time interval between column selection signals is adjusted according to operational speed. The control circuit maintains stable timing relationships while adapting to different operational speeds, preventing malfunctions that would occur with fixed timing at varying frequencies.
Solution Approach 2:
The patent changes the timing parameter from a fixed value to a variable value that adapts to operational speed. By adjusting the time interval between column selection signals based on operational frequency, the system maintains stable operation across different speeds while preserving the essential timing relationships required for correct operation.
Data Source
AI summary
A control circuit for a read operation of a SERDES (SERializer and DESeriallizer) type semiconductor memory apparatus is disclosed that includes a first line driver configured to output a portion of a output signals from sense amplifier according to a first delay signal; a second line driver configured to output a rest of the output signals from the sense amplifier according to a second delay signal; and a first delay unit configured to output a second delay signal synchronized with a clock to the second line driver.