Serial I/O Functional Tester On-Die PRBS Generation
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Solution Overview
Problem
High-speed serial I/O controllers pose challenges in functional testing due to the limitations of existing Automated Test Equipment (ATE) in generating protocol-compliant packetized test data, which can exceed their capabilities and result in increased complexity and cost.
Innovation Solution
A serial I/O functional tester is developed that implements communication protocol-specific functionality on the tester and generates test data, such as pseudorandom bit sequences, on-die, using a functional test controller that combines protocol-specific data with protocol-independent data to reduce bandwidth requirements and support multiple communication protocols.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing Automated Test Equipment (ATE) is used to generate protocol-compliant packetized test data for high-speed serial I/O controllers, then testing capability is provided, but the ATE bandwidth requirements and system complexity increase beyond acceptable levels
Solution Approach 1:
The patent segments the test data generation function into two parts: protocol-specific data generation is performed by the ATE, while protocol-independent pseudorandom data generation is performed by an on-die generator within the device under test. This segmentation allows the ATE to operate at lower bandwidth while still providing comprehensive testing capability.
Solution Approach 2:
The device under test performs self-testing by generating its own protocol-independent test data through an on-die pseudorandom data generator. This self-service approach reduces the burden on external ATE equipment, lowering bandwidth requirements and system complexity while maintaining reliable testing capability.
2Extent of automation
If existing Automated Test Equipment (ATE) generates all test data for high-speed serial I/O controllers, then complete test control is achieved, but ATE bandwidth requirements and costs increase
Solution Approach 1:
The test data generation is segmented between the ATE (protocol-specific portion) and the on-die generator (protocol-independent portion). This division allows automation to be maintained for protocol compliance verification while reducing the bandwidth burden on the ATE by eliminating the need to generate entire high-speed packetized test streams externally.
Solution Approach 2:
The on-die pseudorandom data generator acts as an intermediary between the ATE and the serial I/O controller. It receives control signals from the ATE and autonomously generates the protocol-independent data portion, thereby reducing the bandwidth requirements on the ATE while maintaining automated test control through coordinated operation.
Data Source
AI summary
One embodiment provides an apparatus. The apparatus includes a functional test controller. The functional test controller includes controller logic to receive communication protocol-specific data comprising a packet header from a tester; a protocol buffer to store the packet header; and a pseudorandom bit sequence (PRBS) generator to generate a PRBS. The controller logic is to combine the packet header and the PRBS into a packet and to provide the packet to an input/output (I/O) controller under test.