Serial Signal Testing for Electronic Device Bus Open Circuits

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Solution Overview

Problem

Conventional testing apparatuses for electronic devices face complexity and error-prone processes when testing signal transmission through buses with numerous pins, often requiring manual connection of each pin and relying on visual indicators, which can lead to human error.

Innovation Solution

A testing apparatus and method using serial signal wire pairs to test buses between electronic devices, simplifying the process by generating and receiving serial signals through device transfer plates connected to sockets on a circuit board, allowing for automated determination of open circuits and short circuits without needing to connect each transmission channel individually.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual connection of each pin to testing fixture is used, then testing coverage is complete, but device complexity and ease of operation deteriorate

Engineering Contradiction:
Improvetesting coverageVSAvoidtesting process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A serializer device is introduced as an intermediary component between the testing fixture and the electronic device under test. The serializer receives parallel test signals from the testing fixture, converts them to serial signals, and transmits them through a single bus interface to the electronic device. This intermediary device enables complete testing coverage while avoiding the complexity of manually connecting each pin individually.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If manual connection of each pin to testing fixture is used, then testing coverage is complete, but ease of operation worsens

Engineering Contradiction:
Improvetesting coverageVSAvoidtesting operation ease
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The serializer acts as an automated intermediary that eliminates manual pin-by-pin connection operations. The testing fixture connects to the serializer through standard interfaces, and the serializer automatically handles signal conversion and transmission through the bus, making the testing process easy to operate while maintaining complete testing coverage.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The manual mechanical connection process of connecting each pin individually is replaced by an automated electronic signal conversion system. The serializer electronically converts parallel signals to serial signals and transmits them through the bus, substituting the mechanical pin connection process with an automated electronic system that is much easier to operate.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Device complexity

If indicator light is used for testing result display, then device complexity is low, but measurement precision deteriorates

Engineering Contradiction:
Improvetesting apparatus complexityVSAvoidtesting result accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The testing apparatus incorporates an automated feedback system that receives test results from the electronic device through the bus, processes the results using a testing program, and automatically determines pass/fail status. This feedback mechanism provides precise measurement of testing results while maintaining relatively simple device complexity through automated decision-making logic.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS9285427B2Testing apparatus and testing method of electronic device
Publication Date: 2016.03.15 WISTRON CORP
  • US9285427B2 patent drawing
  • US9285427B2 patent drawing
  • US9285427B2 patent drawing

AI summary

A testing apparatus and a testing method of an electronic device are provided. The testing apparatus includes at least two device transfer plates and a testing circuit. The device transfer plates are electrically and respectively connected to corresponding electronic devices and at least two sockets corresponding to the electronic devices. The testing circuit is electrically connected to the device transfer plates respectively through at least two sets of serial signal wire pairs. According to types of the electronic devices, the testing circuit provides a serial signal to one of the device transfer plates through the corresponding serial signal wire pair and receives a response from another one of the device transfer plates through the corresponding serial signal wire pair, so as to test whether an open circuit is occurred to a bus between the electronic devices respectively corresponding to the device transfer plates.