High-Speed Serial Signal Testing via Phase-Shifted Universal ATE
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Solution Overview
Problem
Universal ATEs face difficulties in testing high-speed serial signals due to sampling rate limitations, requiring expensive equipment and resulting in low efficiency and automation.
Innovation Solution
A method involving an impedance matching unit, phase shift unit, and acquisition unit that transforms and acquires high-speed serial signals using phase shifts, allowing universal ATEs to test signals beyond their sampling rate capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If universal ATE is used to test high-speed serial signals, then test cost is reduced and automation is improved, but the sampling rate limitation prevents direct acquisition of Gbps signals
Solution Approach 1:
The patent applies preliminary action by performing phase shifting and impedance matching on the high-speed serial signal before it reaches the acquisition unit. The phase shift unit pre-processes the signal by adjusting its phase according to controlled steps, and the impedance matching unit pre-adjusts the signal's impedance characteristics. This preliminary processing enables the universal ATE's acquisition unit to successfully capture Gbps signals despite its sampling rate limitation, as the signal is prepared in advance to be compatible with the ATE's capabilities.
2Measurement precision
If high-speed oscilloscope is used to test high-speed serial signals, then signal acquisition capability is improved, but test cost increases and test time lengthens
Solution Approach 1:
The patent introduces intermediary devices between the chip under test and the universal ATE's acquisition unit. The phase shift unit and impedance matching unit act as intermediaries that condition the high-speed serial signal, transforming it into a form that the universal ATE can acquire and process. This intermediary approach eliminates the need for expensive high-speed oscilloscopes while maintaining the ability to test Gbps signals, thereby improving test efficiency and reducing costs.
3Speed
If parallel bus is used for high-speed transmission, then data transmission rate can reach Gbps, but crosstalk and timing constraints become prominent bottlenecks
Solution Approach 1:
The patent creates a universal testing platform that can handle high-speed serial signals using standard universal ATE equipment. The phase shift unit and impedance matching unit are designed with universal applicability, working with various high-speed serial interfaces (such as USB 3.0, SATA, SAS, PCIe) without requiring interface-specific test equipment. This universal approach simplifies the testing infrastructure while maintaining Gbps transmission capability, avoiding the crosstalk and timing constraints associated with parallel buses.
Data Source
AI summary
The invention relates to a universal semiconductor automatic high-speed serial signal testing method, comprising: a chip to be tested sending, to an impedance matching unit, a high-speed serial signal; then by means of a phase shift unit, sequentially transforming, according to a set fixed resolution, the phase of the high-speed serial signal, the magnitude of each offset phase being determined by a phase shift control signal outputted by a control unit and the resolution of the phase shift unit; after passing through the phase shift unit, the high-speed serial signal keeps channel impedance matching by means of the impedance matching unit; the signal entering an acquisition unit, and being acquired under the action of an acquisition control signal sent by the control unit; the control unit performing signal exchange with semiconductor automatic testing equipment (ATE); and the acquisition unit transmitting the acquired signal back to the universal semiconductor ATE for algorithm operation, and then the actual high-speed serial data stream is obtained. The present invention enables direct testing of high-speed serial interface signals by means of the universal ATE during mass production, greatly improving testing convenience and efficiency.