Serialized I/O Test Circuit for Semiconductor Memory Devices
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Solution Overview
Problem
Current semiconductor devices face challenges in efficiently testing multiple devices simultaneously due to limited test equipment channels, necessitating a reduction in input/output channels to minimize test costs and time.
Innovation Solution
A semiconductor system comprising a controller and a semiconductor device with a path control unit, selection transfer units, and a pad section that generates and outputs control codes in parallel or serial formats depending on a test mode signal, allowing for serialization of control codes through a single pad for efficient data transfer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If multiple I/O channels are used for testing semiconductor devices, then test coverage and information output are improved, but test cost and test time increase due to limited test equipment channels
Solution Approach 1:
The patent combines multiple control codes that would normally require multiple I/O channels into a single serialized data stream. The path conversion unit merges parallel control codes from multiple channels into one sequential data flow that can be transmitted through a single I/O channel, reducing the number of test equipment channels needed while maintaining full test information output
Solution Approach 2:
The system dynamically switches between parallel and serial data transmission modes based on the test mode signal. During normal operation, data is transmitted in parallel for high speed, but during test mode, the system dynamically reconfigures to serialize the data stream, allowing the same hardware infrastructure to serve both high-performance operation and cost-effective testing
2Loss of information
If multiple I/O channels are used for testing, then complete device information can be tested, but the number of required test equipment channels increases
Solution Approach 1:
The path conversion unit merges control codes from multiple parallel channels into a single serialized stream, allowing complete device information to be transmitted through one I/O channel. This eliminates the need for multiple test equipment channels while maintaining full information coverage
Solution Approach 2:
The single I/O channel serves multiple functions: it transmits both normal operational data and test data, and the same channel is used for both data output and control code transmission during testing. This multi-functionality reduces the overall number of channels required in the test equipment
3Speed
If parallel control codes are transmitted through multiple pads, then data transfer speed is high, but testing requires more channels and increases cost
Solution Approach 1:
The system dynamically adapts its data transmission mode based on operational requirements. During normal operation, it uses high-speed parallel transmission through multiple pads. During test mode, it dynamically switches to serial transmission through a single pad, accommodating both performance and cost requirements
Data Source
AI summary
A semiconductor system may include a controller and a semiconductor device. The controller may output command/address signals. The semiconductor device may generate a plurality of control codes from the command/address signals in a test mode according to a combination of the command/address signals. The semiconductor device may output a first output datum generated by serializing the plurality of control codes, and the first output datum, through a single pad.