Series Capacitor Charge Flow Circuit for Long-Duration Time Measurement
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Solution Overview
Problem
Existing electronic circuits for time measurement that rely on capacitive storage elements face challenges in maintaining charge retention for extended periods without a power supply, as the discharge speed is heavily influenced by the thickness of the leakage region, which is difficult to control within current manufacturing processes, resulting in short time measurement capabilities.
Innovation Solution
A charge flow circuit comprising a series of capacitive elements, each with a dielectric layer capable of charge leakage by tunnel effect, where the leakage region is formed using a silicon oxide layer, allowing for controlled and slow discharge, enabling time measurement for several hours or days without additional manufacturing steps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the thickness of the leakage region is decreased to increase discharge speed, then the time measurement capability is improved, but the discharge speed becomes too fast to retain charge for extended periods
Solution Approach 1:
The charge retention circuit is divided into multiple capacitive elements connected in series, each with its own leakage region. By segmenting the total leakage path into multiple stages, the patent achieves controlled charge discharge over extended periods while maintaining manufacturability with standard dielectric thicknesses.
Solution Approach 2:
Different capacitive elements have different leakage characteristics achieved by varying the thickness or material properties of their respective dielectric layers. This local differentiation allows optimization of each element's discharge rate to achieve overall extended charge retention.
2Speed
If the surface area of the leakage region is increased to increase discharge speed, then the time measurement capability is improved, but the charge retention time is reduced
Solution Approach 1:
The leakage function is distributed across multiple capacitive elements in series, each with a controlled surface area. This segmentation allows the total leakage effect to be distributed over time, preventing rapid discharge while maintaining the ability to measure extended time periods.
3Duration of action of moving object
If additional manufacturing steps are added to control the leakage region dimensions, then the charge retention time is improved, but the manufacturing complexity and cost increase
Solution Approach 1:
The capacitive elements are designed to be formed using the same manufacturing processes and materials already required for other circuit components on the chip. This multi-functionality approach allows the charge retention circuit to be integrated without adding specialized manufacturing steps, maintaining ease of production while achieving extended charge retention through clever circuit architecture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides a charge flow circuit with a slow leakage rate, allowing for accurate time measurement over extended periods without power, adaptable to various manufacturing processes and integrated circuit designs, enhancing the duration of time measurement capabilities.
Implementation Method 1
said dielectric layer comprising at least one region of smaller thickness capable of letting charges flow by tunnel effect
Data Source
AI summary
A charge flow circuit for a time measurement, including a plurality of elementary capacitive elements electrically in series, each elementary capacitive element leaking through its dielectric space.