Series Fuse Circuit Transistor Isolation
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Solution Overview
Problem
Existing electrically programmable fuse circuits in semiconductor integrated circuits are prone to failure, leading to reduced chip yield as a single fuse cell failure can cause the entire chip to fail, due to their standalone nature.
Innovation Solution
The implementation of a series-connected electrically programmable fuse circuit with multiple fuse cells, where each fuse cell is connected through a transistor to programming terminals, allowing for simultaneous or sequenced control of transistors to apply power voltage and detect programming states, ensuring the circuit remains operational even if a single fuse cell fails.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single standalone fuse cell is used in the electrically programmable fuse circuit, then the circuit structure is simple, but the reliability is low because a single fuse cell failure causes the entire chip to fail
Solution Approach 1:
The fuse circuit is divided into multiple fuse cells connected in series between the anode and cathode. Each fuse cell can be independently controlled by its own transistor, allowing individual programming and failure isolation. This segmentation enables the circuit to maintain functionality even when individual cells fail, resolving the contradiction between reliability and structural simplicity.
2Reliability
If multiple fuse cells are connected in series with individual transistors for each cell, then the reliability is improved through failure isolation, but the device complexity increases due to additional components
Solution Approach 1:
The circuit is segmented into multiple independently controllable fuse cells, each with its own transistor switch. This allows selective programming of individual cells while maintaining overall circuit functionality, improving reliability without requiring complete redesign of the entire fuse structure.
Solution Approach 2:
Each fuse cell is equipped with a transistor that can be dynamically controlled to enable or disable individual cells. This dynamic control allows the circuit to adapt to failures by bypassing defective cells through their respective transistors, maintaining operational reliability while managing component complexity through intelligent control.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces the impact of a single fuse cell failure on the entire circuit, ensuring reliability and maintaining functionality by allowing the circuit to operate in a high impedance state when one fuse cell is inactive, thus enhancing the overall reliability of the electrically programmable fuse circuit.
Implementation Method 1
one terminal of the fuse cell is connected with a first programming terminal corresponding to the fuse cell, and the other terminal of the fuse cell is connected with a second programming terminal corresponding to the fuse cell via a transistor
Implementation Method 2
The eFuse can also be referred to as an electrically programmable silicide polysilicon fuse, for example, a polysilicon fuse (Poly Fuse) using Electro Migration (EM) feature for programming
Implementation Method 3
During fusing of the electrically programmable fuse, the metal silicide between the first and second terminals of the fuse cell is fused via an input current
Data Source
AI summary
An electrically programmable fuse circuit, a programming method for electrically programmable fuse, and a state detection method for electrically programmable fuse are provided. The electrically programmable fuse circuit includes a plurality of fuse cells connected in series, wherein in each of the plurality of fuse cells, one terminal of the fuse cell is connected with a first programming terminal corresponding to the fuse cell, and the other terminal of the fuse cell is connected with a second programming terminal corresponding to the fuse cell via a transistor. Reliability of electrically programmable fuses may be improved.