Series Test Sensor Circuit for Magnetic Field Fault Detection

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Solution Overview

Problem

Existing sensor systems, particularly magnetic field sensors, face challenges in accurately detecting faults under critical operating conditions, leading to potential false positives and incorrect measurements due to material defects or environmental changes.

Innovation Solution

A sensor device with a test sensor connected in series to the main sensor, utilizing a monitor circuit with a processing and determination circuit to compare signals and generate a diagnostic signal, allowing for real-time fault detection and compensation while operating.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a test sensor is connected in series with the main sensor and a monitor circuit is used to compare signals, then diagnostic capabilities are improved and faults are detected, but device complexity increases

Engineering Contradiction:
Improvefault detection capabilityVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent uses a test sensor that is a substantial duplicate of the main sensor to generate a test signal for comparison. This copying approach allows the system to detect faults by comparing the test signal with the main sensor signal, improving reliability while keeping the test structure relatively simple and integrated.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The monitor circuit combines multiple functions (signal processing, comparison, and diagnostic determination) into a single integrated circuit block. This merging of functions improves fault detection capability while minimizing the increase in overall device complexity through functional integration.

Inventive Principle:
Principle #5Merging (Combining)

2Measurement precision

If sensor measurements are taken over time, then measurement data is collected, but measurements drift and accuracy decreases due to environmental changes and aging

Engineering Contradiction:
Improvesensor measurement accuracyVSAvoidmeasurement drift over time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The monitor circuit continuously compares the main sensor signal with the test sensor signal and generates a diagnostic signal based on the comparison. This continuous feedback mechanism allows the system to detect drift and accuracy degradation over time, enabling real-time monitoring and compensation of measurement precision loss.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The test sensor is configured to provide a known test signal before actual measurements are taken. This preliminary action establishes a reference point for comparison, allowing the system to detect subsequent drift or changes in measurement accuracy over time by comparing against this pre-established baseline.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If diagnostic capabilities are added to detect faults, then reliability is improved, but the sensor system size and cost increase

Engineering Contradiction:
Improvefault detection capabilityVSAvoidsystem size and cost
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The monitor circuit is designed to perform multiple functions including signal comparison, fault detection, and diagnostic determination within a single integrated circuit. This multi-functionality approach improves reliability through comprehensive fault detection while minimizing the increase in system size and cost by consolidating diagnostic functions.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

Instead of using complex external diagnostic equipment, the patent uses a simplified test sensor that is a substantial duplicate of the main sensor. This copying approach provides effective fault detection capability while keeping the added component size and cost relatively low compared to using entirely different diagnostic instruments.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS11500020B2Sensor defect diagnostic circuit
Publication Date: 2022.11.15 MELEXIS BULGARIA LTD
  • US11500020B2 patent drawing
  • US11500020B2 patent drawing
  • US11500020B2 patent drawing

AI summary

A sensor device comprises a sensor connected to a first signal and responsive to an external field to produce a sensor signal, a test device connected to a second signal and electrically connected in series with the sensor by an electrical test connection providing a test signal, and a monitor circuit electrically connected to the first, second and test signals. The monitor circuit comprises a processing circuit and a determination circuit. The processing circuit is responsive to the test signal and a predetermined processing value to form a processing output signal. The determination circuit is responsive to the processing output signal to determine a diagnostic signal. A sensor circuit responsive to the sensor signal provides a sensor device signal responsive to the external field.