Server Test Apparatus for Simultaneous PCIe Interface Evaluation
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Solution Overview
Problem
Current test methods for PCIE interfaces on server motherboards are inconvenient and difficult as they require separate testing for the motherboard and functional cards, preventing simultaneous bidirectional testing.
Innovation Solution
A test apparatus with a first connection unit for the motherboard, a second connection unit for the device under test, a data transmission unit that switches between multiple data transmission modes, and a processing unit that controls data transmission to perform test programs for both the motherboard and device under test, with a network unit for remote control and monitoring.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If separate testing is performed for the motherboard and functional card, then the testing can be completed with simple test setups, but the testing process becomes inconvenient and difficult, and bidirectional testing cannot be performed simultaneously
Solution Approach 1:
The patent merges the motherboard testing function and the functional card testing function into a single test apparatus. The test apparatus includes a motherboard connection unit that couples to the motherboard and a device under test connection unit that couples to the functional card, allowing both testing operations to be performed simultaneously through one integrated device rather than requiring separate test setups.
Solution Approach 2:
The test apparatus is designed with multi-functionality to perform both motherboard testing and functional card testing through the same device. The data transmission unit can switch between different testing modes, and the processing unit can execute different test programs based on the selected mode, making the apparatus universal for multiple testing purposes.
2Productivity
If a single test apparatus is used for both motherboard and functional card testing, then bidirectional testing can be performed simultaneously, but the device complexity increases
Solution Approach 1:
The test apparatus is segmented into distinct functional modules: a motherboard connection unit for coupling to the motherboard, a device under test connection unit for coupling to the functional card, a data transmission unit for switching between testing modes, and a processing unit for controlling test programs. This segmentation allows each module to perform its specific function while contributing to the overall capability of simultaneous bidirectional testing.
Solution Approach 2:
The data transmission unit acts as an intermediary between the motherboard connection unit and the device under test connection unit. It switches between different data transmission modes based on selection signals from the processing unit, enabling flexible data transmission for both testing operations without requiring direct complex interconnections between all components.
3Productivity
If manual testing is performed without remote control capability, then the test apparatus structure remains simple, but the testing process becomes time-consuming and less efficient
Solution Approach 1:
The processing unit provides feedback control by receiving selection signals from the external apparatus and automatically switching the data transmission unit between different testing modes. The system can execute test programs automatically based on received commands, reducing manual intervention and improving testing efficiency through automated feedback loops.
Solution Approach 2:
The patent replaces manual mechanical testing operations with automated electronic control through the processing unit and data transmission unit. The external apparatus can remotely control the testing process through electronic signals, substituting manual testing operations with automated electronic control systems that increase testing speed and efficiency.
Data Source
AI summary
A test apparatus for a server includes a first connection unit coupled to a mother board of the server, a second connection unit coupled to a device under test, a data transmission unit, a processing unit, and a network unit. According to a selection signal, the data transmission unit switches one of data transmission modes to perform data transmission between the first connection unit and the second connection unit. The processing unit controls the data transmission unit to perform a first test program for the mother board through the first connection unit, or perform a second test program for the device under test through the first connection unit and the second connection unit. The network unit receives a control signal generated by an external apparatus, so that the external apparatus controls the processing unit to perform the first test program and the second test program through the network unit.