Server-Based Semiconductor Lifetime Prediction via Communication Data Monitoring

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Solution Overview

Problem

Current semiconductor devices, such as CPUs, face challenges in accurately predicting their lifetime based on data size alone, leading to potential failures due to increased communication demands, necessitating a method to predict their lifespan effectively for timely replacement.

Innovation Solution

An information processing system comprising an image forming apparatus with a nonvolatile memory and a server that monitors and predicts the lifetime of the CPU by tracking communication data size, utilizing clock gating control to manage power consumption and prevent failures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If semiconductor devices are designed for high integration and high speed communication, then processing capability and communication speed are improved, but durability and lifetime are deteriorated

Engineering Contradiction:
Improvecommunication speedVSAvoiddevice lifetime
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The system performs preliminary actions by continuously monitoring communication data sizes before actual device failure occurs. The server collects and accumulates data on reading and writing operations, enabling predictive analysis that allows replacement to be scheduled before the interface unit breaks, thus preventing failure rather than reacting to it.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system establishes a feedback loop where the server continuously receives communication data size information from the image forming apparatus, analyzes the accumulated data to predict device lifetime, and provides guidance for timely replacement. This closed-loop feedback mechanism enables dynamic adjustment of maintenance schedules based on actual usage patterns.

Inventive Principle:
Principle #23Feedback

2Device complexity

If only data size of written data is used for prediction, then prediction simplicity is improved, but prediction accuracy is deteriorated

Engineering Contradiction:
Improveprediction method simplicityVSAvoidlifetime prediction accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The system merges multiple monitoring parameters by combining both reading data sizes and writing data sizes into a single comprehensive lifetime prediction model. The server receives and integrates information on both read and write operations, creating a more complete picture of interface unit stress that improves prediction accuracy while maintaining relatively simple implementation.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS11829603B2Information processing system and image forming apparatus capable of accurately predicting lifetime of semiconductor device, and control method therefor
Publication Date: 2023.11.28 CANON KK
  • US11829603B2 patent drawing
  • US11829603B2 patent drawing
  • US11829603B2 patent drawing

AI summary

An information processing system that is capable of accurately predicting a lifetime of a semiconductor device that carries out communications related to reading and writing of data from and to a storage device. The information processing system has an image forming apparatus having a nonvolatile memory and a first controller that controls reading and writing of data from and to the nonvolatile memory. The information processing system also has a server that monitors a lifetime of the first controller. The server has a receiving I/F that receives information indicating a communication data size of reading and writing of data from and to the nonvolatile memory, and a second controller that predicts the lifetime of the first controller based on the received information indicating the communication data size.