Shape Measuring Apparatus Dynamic Irradiation Control

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Solution Overview

Problem

Conventional shape measuring apparatuses using the Scheimpflug principle suffer from decreased measurement accuracy due to variations in the area of irradiation with a line laser, affecting the focus and optical magnification across different positions on the work surface.

Innovation Solution

The shape measuring apparatus employs a tunable lens, electric aperture, or variable slit to adjust the area of irradiation with a line laser, ensuring consistent focus and improved measurement accuracy by controlling the curvature or aperture diameter based on the position of the line laser on the CMOS sensor, thereby maintaining high-accuracy measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the Scheimpflug principle is used to achieve wide range focus, then the focus range is improved, but the area of irradiation with line laser changes and measurement accuracy decreases

Engineering Contradiction:
Improvefocus rangeVSAvoidmeasurement accuracy
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent applies a tunable lens that can dynamically adjust its focal length based on the position of the line laser on the work surface. This dynamic adjustment compensates for the variation in irradiation area caused by the Scheimpflug principle, maintaining consistent measurement accuracy across the entire focus range while preserving the wide range focus capability.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the focal length parameter of the lens dynamically according to the line laser position. By adjusting the focal length parameter in response to the changing irradiation area, the system maintains optimal focus and measurement accuracy throughout the working distance range.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If the area of irradiation with line laser is reduced to improve measurement accuracy, then measurement precision is improved, but the coverage area of the work surface decreases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidirradiation coverage area
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The system dynamically adjusts the line laser irradiation area according to the work surface position and measurement requirements. The tunable lens enables real-time modification of the irradiation area to maintain optimal measurement accuracy while ensuring adequate coverage of the work surface.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent divides the work surface into multiple measurement zones and adjusts the irradiation area separately for each zone. This segmentation allows the system to optimize the irradiation area for each local region while maintaining overall coverage of the entire work surface.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution stabilizes the area of irradiation, reducing variations and enhancing measurement precision by optimizing the focal length and line width of the line laser across the work surface, leading to improved accuracy in surface shape measurement.

Implementation Method 1

The light source produces laser light. The first optical member linearly spreads the laser light from the light source and generates the line laser.

Methodology Applied
Scientific EffectLaser: Laser

Implementation Method 2

The first sensor receives a line laser reflected by the work and captures an image of the work. The lens forms an image of a line laser reflected by the work on an imaging surface of the first sensor.

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS9989356B2Shape measuring apparatus
Publication Date: 2018.06.05 MITUTOYO CORP
  • US9989356B2 patent drawing
  • US9989356B2 patent drawing
  • US9989356B2 patent drawing

AI summary

A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce laser light; a first optical member configured to linearly spread the laser light from the light source and generate the line laser; and a second optical member, provided between the light source and the first optical member, configured to adjust an area of irradiation with a line laser on the work; a first sensor configured to receive a line laser reflected by the work and capture an image of the work; a lens configured to form an image of a line laser reflected by the work on an imaging surface of the first sensor; and a control part configured to control adjustment of the area of irradiation with the line laser on the work by the second optical member.