Vertically Stacked Memory Structure With Shared Gates Over Logic

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Solution Overview

Problem

Existing semiconductor devices face challenges in achieving increased memory cell density, reduced footprint, and improved computing speed due to limitations in integrating memory structures with logic structures, leading to higher manufacturing costs and complexity.

Innovation Solution

The semiconductor device incorporates a memory structure with vertically stacked layers of memory cells and shared vias among multiple gate structures, allowing for increased memory cell density and reduced footprint, while enabling in-memory computing and near-memory computing by overlaying the memory structure over logic structures or interconnection layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If memory structures are integrated with logic structures using existing methods, then device functionality is achieved, but memory cell density is limited and footprint is large

Engineering Contradiction:
Improvememory cell densityVSAvoidfootprint
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent implements vertically stacked memory cells arranged in multiple layers above the logic structure, transitioning from planar two-dimensional layout to three-dimensional vertical stacking. This dimensional change allows significantly more memory cells to be packed into the same footprint area, directly resolving the contradiction between increasing memory cell density and reducing device footprint

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If memory structures are integrated with logic structures using existing methods, then device functionality is achieved, but manufacturing cost and complexity increase

Engineering Contradiction:
Improvememory cell densityVSAvoidmanufacturing complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent combines memory cell formation with the existing logic structure fabrication process by using the logic structure's gate electrodes as shared control gates for the vertically stacked memory cells. This merging eliminates the need for separate, complex memory structure fabrication steps, thereby increasing memory cell density while avoiding proportional increases in manufacturing complexity

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The logic structure's gate electrodes serve dual functions: controlling the logic transistors and controlling the memory cell channels. This multi-functionality allows the same structural elements to perform multiple roles, simplifying the overall device architecture and reducing manufacturing complexity while enabling high-density memory integration

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Speed

If memory structures are integrated with logic structures using existing methods, then device functionality is achieved, but computing speed is limited

Engineering Contradiction:
Improvecomputing speedVSAvoidintegration complexity
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The patent nests the memory cells within the vertical space above the logic structure, with memory cell channels positioned directly over the logic structure's gate electrodes. This nested arrangement minimizes the distance between memory and logic operations, enabling faster data access and computing speed while keeping the integration compact and manageable

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS20260052972A1Semiconductor device and method of making
Publication Date: 2026.02.19 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20260052972A1 patent drawing
  • US20260052972A1 patent drawing
  • US20260052972A1 patent drawing

AI summary

A semiconductor device is provided. The semiconductor device includes a memory structure including a first transistor channel, a gate structure overlying the first transistor channel, and a second transistor channel overlying the gate structure. The gate structure includes a control gate.