Shared Local Oscillator for Phased Array Phase Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current RF device testing equipment is large, slow, expensive, and lacks accuracy due to noise interference and the inability to effectively test high-frequency devices with millimeter wavelengths at different phases and ports, particularly for 5G phased array devices.
Innovation Solution
The use of a shared local oscillator for up-converter and down-converter devices, along with a synchronized digitizer, to eliminate phase errors and synchronize testing equipment, allowing for accurate phase measurement and reduced noise interference, and enabling testing across different phases and ports without the need for path calibration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional separate local oscillators are used for up-converter and down-converter, then device functionality is maintained, but phase errors and noise interference occur reducing measurement accuracy
Solution Approach 1:
The patent merges two separate local oscillators into a single shared local oscillator that serves both the up-converter and down-converter. This consolidation eliminates phase errors between separate oscillators and reduces noise interference, directly improving phase measurement accuracy in RF device testing.
Solution Approach 2:
The shared local oscillator is designed to perform multiple functions: it generates the local oscillator signal for the up-converter and simultaneously provides the reference signal for the down-converter. This multi-functional design eliminates the need for separate oscillators while maintaining signal integrity and phase coherence throughout the testing system.
2Measurement precision
If synchronized digitizer with shared reference signal is used, then phase measurement accuracy improves, but system complexity increases
Solution Approach 1:
The patent combines multiple reference signals into a single shared reference signal that synchronizes the digitizer, up-converter, and down-converter. This approach improves phase measurement accuracy while the synchronization logic manages the complexity through unified timing control rather than multiple independent reference sources.
3Adaptability or versatility
If testing equipment is designed to test high-frequency millimeter wavelength devices at different phases and ports, then testing capability is improved, but equipment size and cost increase
Solution Approach 1:
The testing equipment is designed with universal components that can handle multiple functions: the shared local oscillator serves both conversion paths, the synchronized digitizer processes signals from different ports and phases, and the system can test various phased array configurations. This multi-functionality reduces overall system complexity and cost while maintaining high adaptability for testing different device configurations.
Data Source
AI summary
A local oscillator signal is output from a local oscillator using a reference signal produced by a reference signal generator. Similarly, a test intermediate frequency signal is output from a source oscillator using the reference signal. The test intermediate frequency signal is converted to a test radio frequency signal, with an up-converter using the local oscillator signal. The test radio frequency signal is supplied to a device under test, and an output radio frequency signal is received back from the device under test. The output radio frequency signal is converted to an output intermediate frequency signal, with a down-converter using the local oscillator signal. The output intermediate frequency signal is converted to a digital output signal, with a synchronized digitizer using the reference signal. Different phase signals of the output intermediate frequency signal are captured using the synchronized digitizer as the device under test is operated during a testing cycle.