Sheared Probe Beam Interrogation for Optical Comparison

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Solution Overview

Problem

Existing methods for interrogating the optical properties of probe volumes often require multiple measurements and complex apparatuses, making them inefficient for comparative analysis between target specimen and reference sample probe volumes.

Innovation Solution

A method and apparatus using a single source beam formatted into partially and completely sheared probe beam pairs, allowing simultaneous comparison of optical properties by producing interference patterns that reveal relationships between target specimen and reference sample probe volumes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple separate probe beams and complex scanning apparatus are used to perform comparative optical measurements, then measurement completeness is improved, but device complexity increases

Engineering Contradiction:
Improvecomparative optical measurement accuracyVSAvoidapparatus complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The single probe beam is segmented into multiple spatially separated beam portions through optical splitting elements, allowing simultaneous interrogation of multiple probe volumes without requiring multiple separate light sources or complex scanning mechanisms

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple comparative optical measurements are merged into a single measurement by combining the optical paths of reference and target probe beams through interference, enabling simultaneous comparison of multiple probe volumes with one probe beam

Inventive Principle:
Principle #5Merging (Combining)

2Measurement precision

If multiple measurements are performed to compare optical properties of target and reference probe volumes, then measurement accuracy is improved, but measurement time increases

Engineering Contradiction:
Improveoptical property comparison accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The probe beam continuously interrogates multiple probe volumes simultaneously through parallel optical paths, eliminating the need for sequential measurements and maintaining continuous data acquisition without temporal gaps

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The measurement process transitions from temporal multiplexing (sequential measurements in time) to spatial multiplexing (parallel measurements in space), allowing multiple comparisons to occur simultaneously across different spatial channels

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables convenient and efficient comparison of optical properties between target specimen and reference sample probe volumes using a single measurement, reducing complexity and increasing accuracy through interference patterns detection.

Implementation Method 1

combining the first and second optical beam components to produce a combined optical beam having an interference pattern which reveals an optical property relationship

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentEP2577220B1Apparatus and method for optical interrogation
Publication Date: 2020.04.15 JOFRE CRUANYES MARC
  • EP2577220B1 patent drawingFigure 1
  • EP2577220B1 patent drawingFigure 2
  • EP2577220B1 patent drawingFigure 3

AI summary

An interrogation apparatus and method use a partial shear optical interference apparatus to interrogate the optical properties of an array of target specimen probe volumes as compared to an array of reference sample probe volumes. The apparatus produces a formatted probe beam that contains a partially sheared probe beam pair that is formatted into an array of completely sheared probe beam pairs. Target specimen probe volumes and reference sample probe volumes are suitably organized and exposed to the array of completely sheared probe beam pairs.