Shearing Microscope Slide Periodic Structure for Sample Overlap

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Solution Overview

Problem

Lateral shearing interference microscopes face challenges in accurately measuring densely populated biological samples due to sample overlap in sheared microscopic measurements, leading to data loss and interpretation difficulties.

Innovation Solution

A shearing microscope slide with a periodic structure comprising alternating reference and sample regions, where each reference region is configured to provide a planar reference that removes sample overlap, allowing for accurate sheared microscopic measurements by separating sample images and reducing interference.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a standard biological microscope slide is used for shearing interferometry measurements, then the measurement process is simple, but sample overlap occurs in densely populated samples leading to data loss and measurement artifacts

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidslide structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The microscope slide is segmented into alternating reference regions and sample regions, creating a periodic structure that spatially separates sheared images of densely populated samples, preventing overlap and enabling accurate phase measurements

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Reference regions with planar interfaces act as intermediaries that provide clean reference signals for interferometry, separating the measurement of sample regions and preventing cross-contamination between adjacent sample images

Inventive Principle:
Principle #24Intermediary (Mediator)

2Loss of information

If lateral shearing interferometry is applied to densely populated samples, then phase measurement capability is maintained, but sample overlap generates unwanted artifacts making interpretation difficult

Engineering Contradiction:
Improvedata completenessVSAvoiddata interpretation
Core Design Contradiction:
Loss of informationVSDifficulty of detecting and measuring

Solution Approach 1:

By segmenting the slide into periodic reference and sample regions, the sheared images of densely populated samples are spatially separated, preventing overlap and preserving complete data without artifacts that complicate interpretation

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise and accurate measurement of densely populated biological samples by preventing sample overlap, improving data interpretation and measurement accuracy in shearing interferometry.

Implementation Method 1

Lateral shearing interference microscopes (also referred to as Digital Holographic Microscope, DHM, or Quantitative Phase Imaging, QPI) are used to measure the phase in transmission of light through objects in a sample plane of the microscope

Methodology Applied
Scientific EffectShearing interferometry: Interference

Data Source

PatentUS11248901B2Shearing interferometry measurement device for microscopy
Publication Date: 2022.02.15 NIKON CORP
  • US11248901B2 patent drawing
  • US11248901B2 patent drawing
  • US11248901B2 patent drawing

AI summary

Object interference in biological samples generated by lateral shearing interference microscopes is addressed by a shearing microscope slide comprising a periodic structure having alternating reference and sample regions. In some embodiments, the reference regions are configured to provide references that remove sample overlap in a sheared microscopic measurement. A system for generating sheared microscopic measurements is also provided that comprises an inlet configured to receive a sample material, an outlet configured to release a portion of the sample material, and a periodic structure having a plurality of interleaved reference and sample channels. In some cases, the sample channels are configured to accommodate a flow of sample material from the inlet to the outlet and the reference channels are configured to provide references that remove sample overlap in a sheared microscopic measurement.