Shield Plate Bottom-Edge Geometry for Low-Heat Sample Ion Milling
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Solution Overview
Problem
The Cross Section Polisher apparatus causes thermal damage to samples due to heat generated in the shield plate from ion beam irradiation, as about half of the ion beam strikes the shield plate, leading to heat flow into the sample.
Innovation Solution
A sample milling apparatus with a shield plate where the bottom surface is smaller in area than the shield surface, reducing heat transfer to the sample, and a method involving the use of this shield plate to minimize thermal damage by adjusting the positional relationship between the shield plate and the sample during ion beam irradiation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the shield plate is placed on the sample to protect a part of the sample from ion beam irradiation, then the sample can be milled selectively to form cross sections, but heat generated in the shield plate flows into the sample causing thermal damage
Solution Approach 1:
The shield plate is designed with non-uniform thickness, where the thickness varies in the thickness direction. Specifically, certain regions have greater thickness to absorb more heat and prevent heat flow into the sample, while other regions have lesser thickness. This local variation in thickness creates different thermal mass distribution, allowing selective heat absorption at critical locations without compromising the overall shielding function or cross-section formation quality.
Solution Approach 2:
The invention changes the physical parameter of the shield plate by making the thickness non-uniform. Instead of a constant thickness, the shield plate has varying thickness values at different locations (greater thickness in some regions, lesser thickness in others). This parameter change optimizes the thermal properties of the shield plate, enabling it to absorb and dissipate heat more effectively while maintaining its protective function.
2Reliability
If the shield plate covers a larger area to provide better protection, then more of the sample is shielded, but more heat is generated and transferred to the sample
Solution Approach 1:
The shield plate employs local quality variation through non-uniform thickness distribution. Regions requiring enhanced heat absorption have greater thickness, while regions where minimal heat generation is acceptable have lesser thickness. This localized differentiation allows the shield plate to provide effective shielding coverage without uniformly generating excessive heat across the entire shielded area.
Solution Approach 2:
The invention converts the harmful effect of ion beam irradiation (heat generation) into a beneficial effect by strategically positioning greater thickness regions in the shield plate. These thicker regions act as heat sinks that absorb and dissipate the heat generated by ion beam interaction, preventing heat flow into the sample. Thus, the heat that would otherwise be harmful is redirected and managed through the optimized thickness distribution.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively reduces thermal damage to the sample by suppressing heat generated in the shield plate from flowing into the sample, maintaining the sample's integrity during the milling process.
Implementation Method 1
about a half of the ion beam strikes the shield plate, and, therefore, heat generated in the shield plate flows into the sample
Implementation Method 2
heat generated in the shield plate due to the ion beam irradiation of the shield plate
Implementation Method 3
heat generated in the shield plate flows into the sample
Data Source
Figure 1~2
Figure 3~4
Figure 5~6
AI summary
There is provided a sample milling apparatus capable of mitigating heat damage to a sample. The apparatus (100) mills the sample (S) by irradiating it with an ion beam (IB) and includes: an ion source (10) for emitting the ion beam (IB); and a shield plate (20) placed on the sample (S) and covering a part of the sample (S). The shield plate (20) includes: a shield surface (2) on which the ion beam (IB) impinges; and a bottom surface (4) connected to the shield surface (2) and forming a bottom edge (3). The bottom surface (4) is smaller in area than the shield surface (2).