Shield Interconnect Packaging for Compact EMI-Protected Semiconductors
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional semiconductor packages face issues of excess cost, decreased reliability, and large package sizes, leading to suboptimal performance.
Innovation Solution
The implementation of a semiconductor structure with a conductive structure having a shielding terminal, an electronic component, a package body, and a shield interconnect that connects the shield to the terminal, enhancing electromagnetic interference (EMI) shielding efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional semiconductor packages are used, then manufacturing cost is reduced, but EMI shielding efficiency decreases and reliability decreases
Solution Approach 1:
The shield interconnect is nested within the package body structure, with the shield layer positioned between the package body and the substrate. This nested configuration provides EMI shielding without requiring separate external shielding components, thereby improving shielding efficiency while maintaining manufacturing simplicity.
Solution Approach 2:
The package body serves multiple functions: it provides mechanical support, electrical connection, and EMI shielding. The shield interconnect integrated into the package body structure eliminates the need for separate shielding components, reducing manufacturing complexity while enhancing shielding performance.
2Reliability
If shield layers are exposed, then EMI shielding efficiency increases, but oxidation and corrosion increase
Solution Approach 1:
A conformal dielectric layer is deposited over the shield interconnect, forming a protective thin film that prevents oxidation and corrosion of the shield layer. This dielectric coating maintains the shielding effectiveness while protecting the conductive material from environmental degradation.
Solution Approach 2:
The dielectric layer creates an inert environment around the shield interconnect, isolating it from oxygen and moisture that cause oxidation and corrosion. This protective barrier ensures long-term reliability of the shielding structure.
3Reliability
If package size is reduced, then performance improves, but manufacturing complexity increases
Solution Approach 1:
The shield interconnect is merged with the package body structure, eliminating the need for separate shielding components. This integration reduces the overall package size while maintaining effective EMI shielding, and simplifies manufacturing by reducing the number of assembly steps.
Solution Approach 2:
The shielding function is implemented in the vertical dimension within the package body, rather than requiring lateral expansion. The shield layer is positioned between the package body and substrate in the vertical direction, providing effective shielding without increasing package footprint.
Data Source
AI summary
In one example, a semiconductor structure or device comprises a substrate comprising a conductive structure having a top side and a first shielding terminal on the top side of the conductive structure, an electronic component on the top side of the conductive structure, a package body on the top side of the conductive structure and contacting a side of the electronic component, a shield on a top side of the package body and a lateral side of the package body, and a shield interconnect coupling the shield to the first shielding terminal of the conductive structure. Other examples and related methods are also disclosed herein.


