Shiftable Column Circuitry for Imager Pixel Arrays

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Solution Overview

Problem

Imaging systems face image degradation and loss of quality due to defective column circuitry, where corrupted image signals from defective columns can lead to inaccuracies and the need for data discard or estimation techniques that further degrade image quality.

Innovation Solution

Incorporating extra instances of alternative column circuitry that can be switchably coupled to columns, allowing for the bypassing of defective circuitry and maintaining spatial accuracy by positioning alternative circuitry physically close to affected columns, using multiplexers to reroute signal processing to adjacent or alternative circuitry.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If each column has its own dedicated column circuitry, then image signal processing can be performed independently for each column, but defective column circuitry causes image degradation and loss of quality

Engineering Contradiction:
Improveimage qualityVSAvoidcolumn circuitry configuration
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Column circuitry is designed to serve multiple columns through switchable coupling. A single column circuitry instance can be dynamically assigned to different columns based on operational needs, allowing healthy circuitry to compensate for defective columns without requiring dedicated circuitry for each column.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system implements dynamic reconfiguration of column circuitry assignments during operation. Multiplexers enable real-time switching of column-to-circuitry connections, allowing the system to adapt to defective components and maintain image quality by routing signals through alternative healthy circuitry paths.

Inventive Principle:
Principle #15Dynamics

2Reliability

If data from defective columns is discarded and estimation techniques are applied, then corrupted image signals are avoided, but image accuracy and quality are degraded

Engineering Contradiction:
Improveimage signal accuracyVSAvoidimage data accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

Multiplexers serve as intermediary switching devices that redirect image signals from defective columns to healthy column circuitry instances. This intermediary mechanism allows corrupted signals to be bypassed while maintaining the integrity and accuracy of the remaining image data without requiring estimation techniques.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If alternative column circuitry is positioned physically close to affected columns, then spatial accuracy is maintained, but device complexity increases

Engineering Contradiction:
Improvespatial accuracyVSAvoidcircuitry arrangement
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Alternative column circuitry instances are positioned in close proximity to the columns they serve, maintaining local spatial relationships and accuracy. This localized arrangement ensures that when switching occurs, the spatial integrity of the image data is preserved while the physical layout remains organized and manageable.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS9083904B2Systems and methods for providing shiftable column circuitry of imager pixel arrays
Publication Date: 2015.07.14 SEMICON COMPONENTS IND LLC
  • US9083904B2 patent drawing
  • US9083904B2 patent drawing
  • US9083904B2 patent drawing

AI summary

This is generally directed to systems and methods for providing shiftable column circuitry for a pixel array of an imaging system. Columns of a pixel array can be switchably coupled (e.g., through multiplexers) to their default column circuitry as well as coupled to one or more instances of a neighboring column's column circuitry. In response to an instance of default column circuitry being identified as defective, its corresponding column may “shift” and choose to couple to the neighboring column circuitry. Similarly, all following columns may also shift and couple to a neighboring column circuitry. In some embodiments, the defective column circuitry can be identified during wafer testing and identifying information (e.g., an address) of the defective column circuitry stored in memory. The identifying information may then be accessed from memory and, during an image signal readout phase, used to suitably shift the columns to avoid the defective column circuitry.