Integrated Shmoo Plot Analysis for Memory Pin Testing
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Solution Overview
Problem
The traditional method of manually analyzing test data from semiconductor memory particles is inefficient and prone to errors, making it difficult to distinguish feature differences and trace root causes, which prolongs the product test and output cycles.
Innovation Solution
A method and apparatus that automatically generate integrated shmoo plots for memory particles, marking each test point with a pass proportion to represent the ratio of passed single shmoo plots, allowing for intuitive analysis and reducing manual errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual comparison and analysis of test data is used, then operational flexibility is maintained, but data analysis efficiency is low and manual operation errors are introduced
Solution Approach 1:
The patent replaces manual mechanical comparison and analysis operations with an automated computer-based system. The processor automatically obtains single shmoo plots for each pin, constructs integrated shmoo plots, marks test points with pass proportions, and identifies feature differences without human intervention, thereby eliminating manual operation errors and significantly improving data analysis efficiency
Solution Approach 2:
The system performs self-service by automatically analyzing test data from multiple pins and generating comprehensive integrated shmoo plots. The processor independently obtains individual pin plots, aggregates them into integrated plots, calculates pass proportions, and identifies characteristics without requiring manual guidance or intervention, enabling the system to serve itself in the data analysis process
2Loss of time
If manual analysis methods are used, then operational simplicity is maintained, but time consumption increases and root cause tracing becomes difficult
Solution Approach 1:
The patent segments the analysis process into distinct automated steps: obtaining single shmoo plots for each pin, constructing integrated shmoo plots by aggregating pin data, marking test points with pass proportions, and identifying feature differences. This segmentation allows the complex analysis to be broken down into manageable automated operations that reduce overall time consumption while maintaining systematic thoroughness
Solution Approach 2:
The integrated shmoo plot system serves multiple functions simultaneously: it aggregates data from all pins, visualizes test results across different conditions, marks pass proportions for quick assessment, and enables root cause analysis. This multi-functionality consolidates what would otherwise require multiple separate manual operations into a single comprehensive automated system, reducing time loss without proportionally increasing complexity
3Measurement precision
If integrated shmoo plots with pass proportions are constructed, then feature difference distinction is improved, but data processing complexity increases
Solution Approach 1:
The patent merges individual pin shmoo plots into a single integrated shmoo plot that combines data from all pins. By aggregating the test results and marking each test point with the pass proportion (number of passed pins divided by total pins), the system creates a comprehensive visual representation that enhances feature difference distinction. This merging approach improves measurement precision by providing a holistic view while the automated process manages the inherent data processing complexity
Data Source
AI summary
Embodiments of the present disclosure relate to a method and an apparatus of analyzing data, and a storage medium. The method of analyzing data includes: obtaining a single shmoo plot of each pin of a memory particle; and constructing an integrated shmoo plot of the memory particle based on the single shmoo plot of each of the pins, wherein each test point of the integrated shmoo plot is marked with a pass proportion, and the pass proportion is configured to represent a proportion of a quantity of passed single shmoo plots at a corresponding test point to a total quantity of the single shmoo plots.