Shmoo Plot Testing Apparatus Reducing Measurement Overhead
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Solution Overview
Problem
The existing Shmoo test method for failure analysis of electronic components is time-consuming due to the need for a large number of measurements, which increases the overall testing time and system overload.
Innovation Solution
The proposed method reduces the number of measurements required to generate a Shmoo plot by applying incremental signal values and feedback analysis, allowing for the determination of operation regions with fewer pilot measurements and subsequent targeted further measurements, thereby reducing the total testing time and computation complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a high number of measurements are performed sequentially to generate a Shmoo plot with high resolution over wide parameter ranges, then the measurement precision and completeness of the operation region determination is improved, but the testing time increases significantly
Solution Approach 1:
The patent segments the parameter space into discrete grid points and processes measurements in a systematic sequence. By dividing the wide parameter ranges into manageable increments and processing them in an optimized sequence, the system determines operation regions efficiently without requiring exhaustive measurements of all possible parameter combinations.
Solution Approach 2:
The patent performs preliminary measurements at selected grid points before completing the full Shmoo plot generation. By conducting initial measurements and using the results to guide subsequent measurement locations, the system reduces the total number of measurements needed while maintaining accurate operation region determination.
2Reliability
If a large number of measurements are performed to complete a Shmoo plot, then the completeness of the parameter space coverage is improved, but the system overload increases
Solution Approach 1:
The patent segments the measurement process into discrete steps corresponding to grid points in the parameter space. By processing measurements in segmented batches rather than as a monolithic task, the system reduces peak computational load and memory requirements while ensuring complete parameter space coverage.
Solution Approach 2:
The patent performs measurements at a subset of grid points that are sufficient to determine operation regions, rather than measuring every possible parameter combination. This partial action approach maintains reliability by covering the necessary parameter space while avoiding excessive system overload from unnecessary measurements.
3Measurement precision
If high-resolution measurements are performed over wide parameter ranges, then the accuracy of the Shmoo plot is improved, but the computation complexity increases
Solution Approach 1:
The patent segments the computation into discrete steps corresponding to individual grid point measurements. By processing each measurement and updating the Shmoo plot incrementally rather than computing all results simultaneously, the system reduces computation complexity while maintaining high-resolution accuracy across wide parameter ranges.
Data Source
AI summary
An apparatus is provided that includes a control unit and a memory including computer program code. The apparatus is capable of applying a first signal having a first value and a second signal having a second value to an electronic component and receiving a first feedback signal. The apparatus is capable of determining a first parameter associated with the first feedback signal. The apparatus is capable of applying a third signal having a third value and the second signal to the electronic component and receiving a second feedback signal. The apparatus is capable of determining a second parameter associated with the second feedback signal. The apparatus is capable of applying a fourth signal having a fourth value and the second signal to the electronic component if the first parameter is different from the second parameter.