Short Contact Pin With Elastomer For RF Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current RF device testing solutions face challenges in maintaining signal integrity due to longer contact lengths and imprints, which are unsuitable for small or irregularly shaped contact pads, such as corner chamfer or dimple pads, leading to poorer testing results.
Innovation Solution
An electrical contact with a very short rigid contact pin and a unique design that includes an elastomer, supported by a housing, providing a short wiping stroke and imprint, allowing for effective contact with small or atypically shaped pads, with a contact pin configuration resembling a rotated 'F' shape and a compressible member between its prongs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of moving object
If spring probes with longer contact length are used, then the contact can reach the device pad, but the signal integrity deteriorates
Solution Approach 1:
The patent changes the key parameter of contact length from conventional millimeter-scale lengths to a very short 0.5mm length. This parameter change fundamentally improves signal integrity by reducing the contact length to a minimum necessary for function, thereby minimizing signal degradation while still achieving adequate penetration to the device pad.
Solution Approach 2:
The patent introduces an elastomer as an intermediary component between the rigid contact pin and the device pad. The elastomer acts as a mediator that enables the short rigid contact pin to achieve adequate penetration and maintain reliable electrical contact, resolving the contradiction between short contact length and sufficient penetration depth.
2Adaptability or versatility
If longer wiping stroke is used, then the contact can accommodate various pad positions, but the imprint length increases
Solution Approach 1:
The patent applies partial action by using a minimal wiping stroke that is just sufficient to accommodate small or irregular contact pads. Rather than using a long wiping stroke that would work for all positions, the design uses the minimum necessary stroke length (0.1mm deflection) to achieve adequate contact, thereby minimizing the imprint length to around 50 microns while still functioning for the target application.
3Length of moving object
If shorter contact pin is used, then the signal integrity is improved, but the penetration depth to device pad is reduced
Solution Approach 1:
The patent employs a composite structure combining a rigid contact pin with an elastomer material. The rigid pin provides structural stability and precise positioning, while the elastomer provides compliance and enables adequate penetration depth. This composite approach allows the contact pin to be only 0.5mm long while still achieving sufficient penetration to matte tin plated devices through the elastomer's deformable properties.
4Device complexity
If conventional contact design is used, then the structure is simple, but it cannot test devices with small or irregular contact pads
Solution Approach 1:
The patent applies local quality by concentrating the contact function in a very small, localized area (0.5mm contact pin with 50 micron imprint). The contact design focuses all necessary functionality into a minimal local region, enabling precise contact with small or irregular pads such as corner chamfer or dimple pads, while the overall structure remains relatively simple through the use of basic components (rigid pin, elastomer, housing).
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces the contact pin height to 0.5 mm with 0.1 mm deflection, achieving adequate penetration and a short imprint of around 50 microns, thereby maintaining signal integrity and enabling testing of devices with small or irregular contact pads.
Implementation Method 1
An elastomer, or compressible member, is supported in a space formed between said second member and said third member
Data Source
AI summary
An electrical contact for use in an integrated circuit testing apparatus with a very short conducting contact pin. The shortness of the contact pin is made possible due to the unique design and coupling of the contact pin with an elastomer, and both supported by a housing in such a way that the contact pin test height is brought down to 0.5 mm, while providing a deflection of 0.1 mm with is sufficient in order to provide adequate penetration to matte tin plated devices. The contact pin of this invention looks almost like the letter “F”, rotated 90° to the left, so that it lies on its left side. The rectangular shaped elastomer is placed between the prongs of the “F”. The bottom part of the “F” is curved upwards so that it is almost parallel to the prongs.