Short Super Block Bitmap for Memory Reliability
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Solution Overview
Problem
Existing memory systems face inefficiencies in forming super blocks due to initial bad blocks, leading to wasted memory space and reduced performance, especially when these blocks are concentrated on specific planes.
Innovation Solution
A memory system that forms a short super block by detecting initial bad blocks and replacing them with spare blocks, generating a bitmap to differentiate normal and initial bad blocks, allowing for simultaneous access and operation on normal blocks within the short super block.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a re-mapping operation is performed to replace initial bad blocks, then reliability is improved, but productivity deteriorates due to the time-consuming nature of the operation
Solution Approach 1:
The patent performs preliminary detection and classification of initial bad blocks during manufacturing before the memory device is put into service. By identifying and marking these blocks in advance, the system avoids time-consuming re-mapping operations during normal operation, thus improving productivity while maintaining reliability through pre-established spare block mappings.
2Reliability
If initial bad blocks are excluded from super block formation, then reliability is improved, but productivity worsens due to wasted memory space
Solution Approach 1:
The patent segments the memory device into multiple planes and allows super blocks to be formed independently in each plane. Initial bad blocks in one plane do not prevent super block formation in other planes, thus improving memory utilization while maintaining reliability by excluding only the specific defective blocks from their respective super blocks.
Solution Approach 2:
The patent applies different treatments to different regions of the memory device based on their quality. Normal blocks are included in super blocks for high-utilization operations, while initial bad blocks are excluded and handled separately using spare blocks. This local differentiation optimizes both reliability and productivity by treating each block according to its actual status.
3Manufacturing precision
If re-mapping operation is performed to replace initial bad blocks, then manufacturing precision is improved, but loss of time increases
Solution Approach 1:
The patent performs preliminary detection and classification of initial bad blocks during manufacturing before the memory device is put into service. By identifying and marking these blocks in advance, the system avoids time-consuming re-mapping operations during normal operation, thus improving productivity while maintaining reliability through pre-established spare block mappings.
Data Source
AI summary
A memory system includes a memory device; a short super block detecting unit suitable for forming, when one or more initial bad blocks remain in an original super block after a re-mapping operation is performed and a number of the initial bad blocks is equal to or less than a predetermined threshold value within the original super block, a short super block with memory blocks included in the original super block; a bitmap generating unit suitable for generating a bitmap representing whether each of the memory blocks included in the short super block is a normal block or an initial bad block; and a processor suitable for controlling the memory device to simultaneously perform a normal operation on normal blocks among the memory blocks included in the short super block based on the bitmap.