Shunt Resistor Jumper Protrusion for Stable Voltage Detection
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Solution Overview
Problem
Existing shunt resistors experience variations in detected voltage, resistance, and temperature coefficient of resistance due to the connection position of wires for voltage detection, which affect their characteristics.
Innovation Solution
A jumper element with a protrusion located to avoid overlapping the resistance element and potentially forming a slit in the protrusion to adjust resistance and temperature coefficient of resistance, ensuring uniform potential distribution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the connection position of the wire for voltage detection is shifted, then the detected voltage and detected resistance vary, but the shunt resistor can still function for current detection
Solution Approach 1:
The protrusion is designed to create an equipotential region where the potential distribution is uniform. By positioning the wire connection on the protrusion surface, any connection point within this region maintains the same potential, thereby eliminating variations in detected voltage and resistance caused by connection position shifts.
2Reliability
If the connection position of the wire for voltage detection is shifted, then the temperature coefficient of resistance varies, but the shunt resistor remains operational
Solution Approach 1:
The protrusion creates a uniform potential distribution region that stabilizes the electrical characteristics. By connecting the wire to this equipotential region, the temperature coefficient of resistance becomes independent of the connection position, ensuring consistent measurement precision across different assembly variations.
3Measurement precision
If a protrusion is formed on the jumper element, then the potential distribution uniformity is improved, but the device complexity increases
Solution Approach 1:
The jumper element is segmented into a body structure and a protrusion. This segmentation allows the protrusion to serve as a dedicated equipotential connection region, simplifying the overall design by separating the current conduction function (body) from the voltage detection function (protrusion).
Solution Approach 2:
The protrusion acts as an intermediary structure between the wire connection and the resistance element. It mediates the electrical connection by providing a uniform potential distribution, thereby simplifying the assembly process and reducing sensitivity to connection position variations.
4Reliability
If the protrusion overlaps the resistance element, then the electrical connection is enhanced, but the potential distribution uniformity deteriorates
Solution Approach 1:
The protrusion is positioned with specific local quality characteristics - it extends from the body structure but is configured to avoid overlapping the resistance element. This local positioning creates a uniform potential distribution region on the protrusion surface while maintaining electrical connection through the body structure, resolving the contradiction between connection reliability and potential uniformity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution suppresses variations in detected voltage, resistance, and temperature coefficient of resistance by maintaining consistent characteristics regardless of wire connection positions, enhancing the reliability and accuracy of current detection.
Implementation Method 1
the jumper element is made of conductive metal material
Implementation Method 2
the protrusion is located so as not to overlap the resistor element... maintaining consistent characteristics regardless of wire connection positions
Data Source
AI summary
The present invention relates to a jumper element, a shunt resistor apparatus, and a method of adjusting characteristic of a shunt resistor apparatus for current detection. The jumper element (10) for constituting the shunt resistor apparatus for current detection is made of conductive metal material. The jumper element (10) includes: a body structure (11) that can be coupled to a resistance element (5) constituting a part of the shunt resistor apparatus; and a protrusion (12) formed on a side portion of the body structure (11), wherein the protrusion (12) is located so as not to overlap the resistor element (5).