α-Type Sialon Phosphor Plates with Iβ/Iα Phase-Ratio Control

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing phosphor plates, particularly those using α-type sialon phosphor, suffer from decreased light emission intensity, necessitating improvements in optical characteristics for enhanced performance.

Innovation Solution

The phosphor plate is designed with a specific ratio (Iβ/Iα ≤ 10) of peak intensities in an X-ray diffraction pattern, using a α-type sialon phosphor dispersed in a base material, to stabilize optical characteristics and improve light emission intensity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If α-type sialon phosphor is used in a plate-like wavelength conversion member, then the phosphor plate can be manufactured with standard materials, but the light emission intensity decreases

Engineering Contradiction:
ImprovemanufacturabilityVSAvoidlight emission intensity
Core Design Contradiction:
Ease of manufactureVSIllumination intensity

Solution Approach 1:

The patent applies parameter changes by controlling the crystalline phase composition ratio of the sialon phosphor. Specifically, it defines a range for the β-phase content (5-20 mass%) and controls the Iβ/Iα ratio in X-ray diffraction patterns to optimize light emission intensity while maintaining manufacturability with standard materials.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent uses composite materials by combining α-type sialon phosphor with a glass matrix base material. This composite structure allows the phosphor particles to be dispersed in a transparent matrix, improving light transmission and emission intensity while maintaining ease of manufacture through standard ceramic processing techniques.

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If the crystalline phase composition of sialon phosphor is not controlled, then the manufacturing process is simple, but the optical characteristics become unstable

Engineering Contradiction:
Improveprocess simplicityVSAvoidoptical characteristic stability
Core Design Contradiction:
Ease of manufactureVSStability of the object's composition

Solution Approach 1:

The patent implements feedback by using X-ray diffraction analysis to measure the Iβ/Iα ratio of the phosphor phases and adjusting the manufacturing process accordingly. This feedback mechanism ensures that the β-phase content remains within the optimal range of 5-20 mass%, stabilizing optical characteristics while maintaining relatively simple manufacturing processes.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution results in a phosphor plate with improved light emission intensity and stability, suitable for use in light emitting devices, enhancing luminance and durability.

Implementation Method 1

a plate-like composite including a base material and an α-type sialon phosphor present in the base material

Methodology Applied
Scientific EffectPhotoluminescence: Photoluminescence

Implementation Method 2

in an X-ray diffraction analysis pattern of the phosphor plate using a Cu-Kα ray, in a case in which peak intensity corresponding to the α-type sialon phosphor having a diffraction angle 2θ in a range of 30.2° or more and 30.4° or less is defined as Iα

Methodology Applied
Scientific EffectX-ray diffraction: Diffraction

Data Source

PatentUS12428594B2Phosphor plate and light emitting device
Publication Date: 2025.09.30 DENKA CO LTD
  • US12428594B2 patent drawing
  • US12428594B2 patent drawing

AI summary

A phosphor plate includes a plate-like composite including a base material and an α-type sialon phosphor present in the base material, in which, in an X-ray diffraction analysis pattern using a Cu-Kα ray, in a case in which peak intensity corresponding to the α-type sialon phosphor having a diffraction angle 2θ in a range of 30.2° or more and 30.4° or less is defined as Iα and peak intensity of a peak having a diffraction angle 2θ in a range of 26.6° or more and 26.8° or less is defined as Iβ, Iα, and Iβ satisfy 0<Iβ/Iα≤10.