SiC Power Semiconductor Layout for Better Heat Dissipation

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Solution Overview

Problem

Existing power semiconductor devices face challenges in achieving high heat dissipation characteristics, particularly in high-voltage and high-current environments, which are essential for applications like power conversion and inverters.

Innovation Solution

The design incorporates a power semiconductor device with a substrate comprising SiC, featuring a first and second region with a well region of a different conductivity type, a source region, a gate electrode, and a passivation layer that defines a recessed portion between the regions, enhancing heat dissipation by integrating a transistor and a Schottky barrier diode on a shared substrate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If a power semiconductor device operates in high-voltage and high-current environments, then it achieves high-power switching capability, but heat dissipation becomes insufficient

Engineering Contradiction:
Improvehigh-power switching capabilityVSAvoidheat dissipation
Core Design Contradiction:
PowerVSTemperature

Solution Approach 1:

The substrate is divided into a first region containing a transistor and a second region containing a Schottky barrier diode, allowing independent optimization of each region's thermal characteristics. The transistor region can be designed for high-power switching while the diode region provides additional heat dissipation capacity, resolving the contradiction between high-power capability and heat dissipation by spatially separating and independently managing thermal loads in different substrate regions.

Inventive Principle:
Principle #1Segmentation

2Strength

If SiC material is used instead of silicon, then voltage withstand characteristics improve, but heat dissipation management becomes more challenging

Engineering Contradiction:
Improvevoltage withstand characteristicsVSAvoidheat dissipation management
Core Design Contradiction:
StrengthVSTemperature

Solution Approach 1:

The patent combines a transistor and a Schottky barrier diode on a single SiC substrate, creating a hybrid structure where the diode region serves dual purposes: electrical functionality and enhanced heat dissipation. The SiC material's superior voltage withstand characteristics are maintained while the integrated diode structure provides additional thermal management capability, resolving the contradiction between high-voltage performance and heat dissipation management.

Inventive Principle:
Principle #5Merging (Combining)

3Temperature

If a larger substrate area is used, then heat dissipation improves, but device complexity increases

Engineering Contradiction:
Improveheat dissipation efficiencyVSAvoiddevice structure complexity
Core Design Contradiction:
TemperatureVSDevice complexity

Solution Approach 1:

The second region of the substrate is designed with multi-functionality: it contains a Schottky barrier diode for electrical operation and simultaneously serves as an extended heat dissipation region. This universal design allows the same substrate area to fulfill both electrical and thermal management functions, improving heat dissipation efficiency without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration improves heat dissipation efficiency by transferring heat generated by the transistor to the substrate of the diode, utilizing a larger area semiconductor substrate, thereby optimizing thermal management.

Implementation Method 1

improves heat dissipation efficiency by transferring heat generated by the transistor to the substrate of the diode

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS20260076186A1Power semiconductor devices
Publication Date: 2026.03.12 SAMSUNG ELECTRONICS CO LTD
  • US20260076186A1 patent drawing
  • US20260076186A1 patent drawing
  • US20260076186A1 patent drawing

AI summary

A power semiconductor device includes a substrate including SiC of a first conductivity type and including a first region and a second region, a drift layer of the first conductivity type on the substrate and in the first and second regions, a well region of a second conductivity type on the drift layer and in in the first region, a source region of the first conductivity type within the well region, a gate electrode on and extending along an upper surface of the well region, a source electrode connected to the source region in the first region, a metal layer connected to the drift layer in the second region, and a passivation layer covering the source electrode and the metal layer. The passivation layer defines a recessed portion between the first region and the second region.