Signal Parameter Measurement Using Packet Train Analysis
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Traditional testing methods for wireless devices are time-consuming due to the sequential measurement of signal parameters, which increases overall test time, especially with modern transmitters and receivers capable of multiple frequencies and data rates.
Innovation Solution
A method that captures and analyzes a train of data packets with varying properties to measure multiple signal parameters simultaneously, using advanced equipment like vector signal analyzers to reduce test time by measuring properties like output power, EVM, and spectral mask in a single transmission.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sequential measurement of signal parameters is used, then measurement precision is maintained, but test time increases significantly
Solution Approach 1:
The patent combines multiple separate measurement processes (power measurement, EVM measurement, spectral mask measurement) into a single integrated measurement system. The vector signal analyzer simultaneously captures and analyzes multiple signal parameters from the same transmitted packet train, eliminating the need for sequential measurements and reducing test time while maintaining measurement precision through synchronized multi-parameter analysis.
Solution Approach 2:
The patent implements continuous measurement by capturing a packet train and analyzing multiple parameters from the same continuous signal flow. Instead of stopping and restarting measurements for each parameter, the system continuously acquires signal data and performs parallel analysis of power, EVM, and spectral characteristics, ensuring no useful measurement opportunity is lost and maximizing measurement efficiency.
2Measurement precision
If multiple packet trains are transmitted for each parameter measurement, then accurate measurements are obtained, but productivity decreases
Solution Approach 1:
The patent employs a universal measurement platform (vector signal analyzer) that can simultaneously perform multiple measurement functions including power measurement, EVM analysis, and spectral mask verification. This single instrument replaces multiple specialized measurement devices, allowing all parameters to be measured from one packet train transmission, thereby increasing productivity while maintaining the accuracy requirements for each parameter through dedicated analysis algorithms.
3Device complexity
If traditional sequential testing equipment is used, then device complexity is minimized, but measurement capability is limited
Solution Approach 1:
The patent utilizes a vector signal analyzer that can dynamically change measurement parameters and analysis methods based on the specific parameter being measured. The system adapts its measurement approach for power, EVM, and spectral mask by adjusting analysis algorithms and signal processing methods, providing versatile measurement capability across multiple parameters while maintaining manageable device complexity through software-configurable measurement modes.
Data Source
AI summary
A method is disclosed for measuring one or more parameters of a signal generated by a signal generator. The method employs capturing and analyzing a train of data packets or other forms of signals from a single transmission to obtain measured values for the one or more parameters. The obtained measured values may be used in valuing a calibration of a signal generator or in verifying the already calibrated values of the signal generator. In accordance with a preferred embodiment, the train of data packets contains packets having different properties.