Signal Skew Measurement Using Under-Sampling and Convolution
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Solution Overview
Problem
High-speed signal skew measurement in integrated circuits (ICs) is challenging due to signal jitter and the difficulty in sampling high-speed signals, which affects the accuracy of phase difference measurement between IC output signals.
Innovation Solution
A signal skew measurement method involving under-sampling, digital conversion, convolution, and delay calibration to accurately determine the skew between IC output signals, using a processor and memory-based apparatus with modules for under-sampling, digital conversion, convolution, and skew measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If high-speed signal sampling is performed directly, then measurement speed is improved, but measurement precision deteriorates due to signal jitter and sampling difficulty
Solution Approach 1:
The patent applies preliminary action by performing delay calibration on the test hardware circuit before actual skew measurement. The calibration process pre-determines the delay characteristics of the measurement system, which are then used to compensate for jitter and sampling errors during high-speed signal measurement, enabling accurate phase difference measurement despite high transmission speeds
Solution Approach 2:
The patent introduces an intermediary calibration process that mediates between the high-speed signal source and the measurement system. By measuring and compensating for the test hardware circuit's delay characteristics separately, the system can accurately measure skew without being directly affected by signal jitter and sampling limitations
2Adaptability or versatility
If test hardware circuit wiring is extended to accommodate measurement equipment, then measurement capability is improved, but measurement precision deteriorates due to increased wiring delay and jitter
Solution Approach 1:
The patent treats the test hardware circuit wiring as an intermediary element whose characteristics are measured and compensated for. By separately calibrating the delay introduced by extended wiring and using this calibration data to correct measurements, the system maintains measurement capability while eliminating the precision degradation caused by additional wiring
Solution Approach 2:
The patent implements feedback by using the measured delay characteristics of the test hardware circuit to compensate for errors in subsequent measurements. The calibration results are fed back into the measurement process to correct for wiring-induced delays and jitter, maintaining accuracy despite extended signal paths
Data Source
AI summary
The present invention discloses a signal skew measurement method for integrated circuit, a medium, and an electronic device. The method comprises: by a test machine, acquiring a first signal and a second signal output by an IC, respectively performing under-sampling on the first and second signals to obtain a first sampled signal and a second sampled signal; respectively performing digital conversion on the first and second sampled signals based on a preset threshold voltage to obtain a first digital signal and a second digital signal; respectively performing convolution on the first and second digital signals using a preset pulse signal to obtain a first comparison signal and a second comparison signal; and calculating a skew between the first and second comparison signals to obtain a reference skew, and determining a skew between the first and second signals according to the reference skew.