Silicon Fragment Sorting Using Height-Aided Size Measurement
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Solution Overview
Problem
Existing methods for sorting silicon fragments based on two-dimensional projection are prone to errors due to variations in fragment orientation, leading to miscalculations of size and subsequent misclassification.
Innovation Solution
A method and device that utilize additional height information from multiple measuring devices positioned around the fragment to capture its dimensions from different angles, combining 2D projection surface data with height data to accurately calculate the fragment's size and control deflection devices accordingly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If two-dimensional projection measurement is used for fragment size determination, then the measurement process is simple, but sorting errors occur due to fragment orientation variations
Solution Approach 1:
The patent transitions from two-dimensional projection measurement to three-dimensional measurement by adding height information capture. Multiple measuring devices are positioned at different spatial locations (above and below the profile plane) to capture height data, enabling accurate 3D reconstruction of fragment dimensions regardless of orientation. This dimensional expansion resolves the contradiction by maintaining measurement simplicity through automated multi-angle capture while achieving precise size determination.
2Measurement precision
If multiple measuring devices are positioned around the fragment to capture height information, then sorting precision is improved, but device complexity increases
Solution Approach 1:
The patent implements universal measuring devices that can capture both projection surface and height information. The first measuring device captures the projection surface in the profile plane, while the same or additional devices capture height information above and below the plane. This multi-functional approach allows a single measuring system to perform multiple measurement tasks, reducing overall device complexity while maintaining high measurement precision through comprehensive data capture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces sorting errors by ensuring precise size determination, resulting in improved separation quality and reduced misclassification rates.
Implementation Method 1
capturing the projection surface of a fragment in a 2D profile plane with at least one first measuring device
Implementation Method 2
capturing at least one height information above and/or below the 2D profile plane with at least one further measuring device
Data Source
Figure 1~2
AI summary
The invention relates to a method for sorting fragments, said method comprising the following steps: - separating the fragments in a separating region, - detecting the projection surface of a fragment in a 2D profile plane using a first measurement device, - detecting at least one piece of height information above and/or below the 2D profile plane using a further measurement device, - calculating the size of the fragment from the projection surface and height information, - controlling at least one deflection device depending on the calculated size. The invention further relates to a device for performing the method.