Multiple-Chamber Reactor for Void-Free Silicon Gap Filling

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Solution Overview

Problem

The miniaturization of semiconductor devices has made it challenging to fill gaps in substrates for shallow trench isolation, inter-metal, and passivation layers with high-quality, void-free material.

Innovation Solution

A multiple-chamber reactor system is used, comprising reaction chambers for depositing silicon layers into gaps on substrates, exposing these layers to vacuum ultraviolet radiation, and optionally treating them to form layers comprising silicon and oxygen with desired properties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a single-chamber reactor system is used for gap filling, then the device complexity is low, but the manufacturing precision and material quality are insufficient due to contamination and voids

Engineering Contradiction:
Improvegap filling qualityVSAvoidreactor system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The reactor system is divided into multiple separate chambers (first reaction chamber for deposition, second reaction chamber for exposure, third reaction chamber for treatment) that can operate independently. Each chamber is optimized for its specific function, allowing precise control over the gap filling process and subsequent treatment steps without contamination from other processes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A transfer chamber serves as an intermediary between the different reaction chambers, enabling substrate transport without exposing the substrate to ambient conditions. This intermediary chamber maintains the controlled environment throughout the multi-step process, preventing contamination while allowing sequential processing.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If multiple processing steps are performed in separate chambers, then the material quality and reduced contamination are improved, but the loss of time increases due to substrate transfer

Engineering Contradiction:
Improvematerial qualityVSAvoidsubstrate transfer time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The multiple reaction chambers are integrated into a single reactor system with shared infrastructure including the transfer chamber, substrate handling mechanism, and control systems. This merging allows coordinated operation of all chambers, minimizing transfer time while maintaining the benefits of separate processing zones for high material quality.

Inventive Principle:
Principle #5Merging (Combining)

3Ease of operation

If the substrate is exposed to ambient conditions between processing steps, then the ease of operation is improved, but the object-generated harmful factors increase due to contamination

Engineering Contradiction:
Improvesubstrate handlingVSAvoidcontamination
Core Design Contradiction:
Ease of operationVSObject-generated harmful factors

Solution Approach 1:

The reactor system maintains a controlled inert atmosphere throughout all chambers, preventing exposure of the substrate to ambient air and contaminants. The transfer chamber and reaction chambers are sealed environments that preserve the substrate integrity from deposition through final treatment, eliminating contamination while enabling operational flexibility.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces contamination, provides deposited materials with desired properties, and increases throughput by allowing for the deposition, exposure, and treatment of layers in a single process module without exposing the substrate to ambient conditions.

Implementation Method 1

a first reaction chamber configured to deposit a layer comprising silicon into a gap on a substrate

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Implementation Method 2

a second reaction chamber configured to expose the deposited layer to vacuum ultraviolet radiation to form an exposed layer

Methodology Applied
Scientific EffectVacuum ultraviolet radiation: Photodissociation

Data Source

PatentUS20250171892A1Apparatuses and methods for filling a gap
Publication Date: 2025.05.29 ASM IP HLDG BV
  • US20250171892A1 patent drawing
  • US20250171892A1 patent drawing
  • US20250171892A1 patent drawing

AI summary

A method and system for depositing silicon using a multiple-chamber reactor are disclosed. An exemplary method includes performing one or more deposition cycles and performing a vacuum ultraviolet radiation, and an optional anneal.