Low-Loss Silicon Nitride Waveguides for UV-Visible Light

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Solution Overview

Problem

Waveguides experience high optical losses at shorter wavelengths, such as ultraviolet light, leading to increased energy consumption and potential damage, making it challenging to efficiently guide high-power ultraviolet and visible light to target locations.

Innovation Solution

The development of low loss silicon nitride films and waveguide cores with optical losses of less than 1 dB per centimeter at 488 nm, achieved through chemical vapor deposition and subsequent annealing at temperatures above 400°C, which reduces power requirements and minimizes waveguide damage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of energy

If conventional waveguides are used to guide ultraviolet and visible light, then the waveguide structure provides light guidance, but high optical losses occur leading to increased energy consumption and potential damage

Engineering Contradiction:
Improveoptical power lossVSAvoidwaveguide damage risk
Core Design Contradiction:
Loss of energyVSReliability

Solution Approach 1:

The patent changes the material parameters of the waveguide core by using silicon nitride with specific stoichiometry (Si:N ratio) and crystal structure, achieving low optical loss at ultraviolet and visible wavelengths. The annealing process at 400-1100°C for 10-200 hours further optimizes the material parameters by reducing stress and improving the refractive index uniformity, resulting in optical losses of less than 1 dB/cm at 488 nm

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs a composite waveguide structure consisting of a silicon nitride core layer with specific properties embedded in a cladding layer. The core material is engineered to have high refractive index and low optical loss, while the cladding provides mechanical support and optical confinement, creating a composite system that optimizes both light guidance and low loss transmission

Inventive Principle:
Principle #40Composite materials

2Loss of energy

If annealing is performed for extended periods at high temperatures to reduce optical losses, then optical loss decreases to less than 1 dB per cm, but manufacturing time and energy consumption increase

Engineering Contradiction:
Improveoptical lossVSAvoidannealing time
Core Design Contradiction:
Loss of energyVSLoss of time

Solution Approach 1:

The patent establishes specific annealing parameters (temperature range of 400-1100°C and time range of 10-200 hours) that optimize the trade-off between optical loss reduction and processing time. By controlling these parameters, the patent achieves optical losses of less than 1 dB/cm at 488 nm while providing a defined processing window that balances quality improvement with manufacturing efficiency

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution significantly reduces optical power loss and energy consumption while maintaining the ability to effectively guide ultraviolet and visible light, improving the performance of waveguides in various applications, including quantum computing systems.

Implementation Method 1

annealing the silicon nitride film for at least ten hours at a temperature of at least 400° C.

Methodology Applied
Scientific EffectAnnealing: Annealing

Implementation Method 2

the silicon nitride film is formed using chemical vapor deposition

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS20240079228A1Low loss silicon nitride and waveguides comprising low loss silicon nitride
Publication Date: 2024.03.07 QUANTINUUM LLC
  • US20240079228A1 patent drawing
  • US20240079228A1 patent drawing
  • US20240079228A1 patent drawing

AI summary

A low loss silicon nitride film is formed by depositing a silicon nitride film on a substrate and annealing the silicon nitride film for at least ten hours at a temperature of at least 400° C. to cause the silicon nitride film to become a low loss silicon nitride film. The low loss silicon nitride film has an optical loss of less than 1 dB per cm at a wavelength of 488 nm.