Silicon Photonics Interrogator for Polarized Light Measurement
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Solution Overview
Problem
Existing reflected light wavelength scanning devices lack miniaturization and cost-effectiveness, and struggle with accurate measurement of polarized light sources due to limitations in interrogator technology.
Innovation Solution
A reflected light wavelength scanning device incorporating a silicon photonics interrogator with a polarization wave controller, high-resolution arrayed waveguide grating, photodetector array, and control unit, which separates and processes polarized light to enhance measurement accuracy and miniaturization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional optical fiber interrogators are used, then measurement accuracy is maintained, but device size and cost increase
Solution Approach 1:
The patent replaces traditional mechanical/optical interrogator components with a silicon-based photonic integrated circuit. The silicon photonics platform integrates multiple optical functions (waveguides, gratings, detectors) onto a single chip, eliminating the need for bulky mechanical assemblies while maintaining measurement precision through precise optical path control and wavelength demultiplexing.
Solution Approach 2:
The patent combines multiple interrogator functions into a single integrated silicon photonic device. The system merges light source coupling, wavelength demultiplexing via arrayed waveguide gratings, polarization control, and photodetection into one compact unit, achieving miniaturization while preserving measurement accuracy through coordinated operation of integrated components.
2Measurement precision
If traditional optical fiber interrogators are used, then measurement accuracy is maintained, but manufacturing cost increases
Solution Approach 1:
The patent replaces expensive traditional optical interrogator components with a silicon-based photonic integrated circuit. The silicon photonics platform leverages CMOS-compatible manufacturing processes, enabling high-volume production at lower costs while maintaining measurement precision through integrated optical paths and wavelength demultiplexing capabilities.
Solution Approach 2:
The patent changes the material platform from traditional optical components to silicon photonics, utilizing the mature CMOS semiconductor manufacturing ecosystem. This parameter change enables standardization and economies of scale, reducing per-unit manufacturing cost while maintaining measurement accuracy through precisely controlled optical waveguide geometries and grating structures.
3Measurement precision
If polarization separation is not implemented, then device complexity is reduced, but measurement accuracy deteriorates
Solution Approach 1:
The patent combines polarization control and wavelength demultiplexing functions into a single integrated silicon photonic device. The arrayed waveguide grating structure inherently handles both polarization management and spectral separation, achieving accurate polarized light measurement without requiring separate polarization optics, thereby maintaining measurement accuracy while limiting complexity growth.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device achieves accurate measurement of light sources and miniaturization, reducing costs while improving measurement precision through the use of silicon-based components and advanced light processing techniques.
Implementation Method 1
a polarization beam splitter (PBS) that splits polarized light into TE polarized light and TM polarized light by a difference in refractive index
Implementation Method 2
a high-resolution arrayed waveguide grating for distributing the light passing through the front-end switching unit for each channel according to a wavelength band
Implementation Method 3
a photodetector array comprising a plurality of photodetectors connected to each channel of the high-resolution arrayed waveguide grating
Implementation Method 4
The reflected wavelength is called a Bragg wavelength that determined by the effective refractive index in the core region and the spatial periodicity in which the refractive index changes
Data Source
AI summary
A reflected light wavelength scanning device having a silicon photonics interrogator is provided. The device includes: a light source module for outputting broadband light; an optical sensor that receives light output from the light source module through a circulator, reflects light in a specific band to the circulator, and transmits light in a band other than the specific band; and an interrogator for selectively injecting the polarized light by separating the polarized light from the reflected light input through the circulator.