Silicon Wafer Sensor Constraint With Through-Holes

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Solution Overview

Problem

Existing sensor assemblies face accuracy impairments due to thermal and mechanical stresses transferred from the package and die attach to the sensor die, with conventional constraints being either ineffective, expensive, or prone to early failure.

Innovation Solution

A sensor assembly constraint comprising a silicon wafer with a passageway and a flexible structure extending from it, which is monolithically formed with beams and trenches, providing flexibility to isolate the sensor die from stresses by being attached to the substrate via a die attach material.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a glass constraint is used to limit stress transfer, then the sensor die accuracy is improved, but the manufacturing cost increases and production difficulty increases

Engineering Contradiction:
Improvesensor die accuracyVSAvoidproduction difficulty
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent changes the material parameter from glass to silicon, and structurally from a solid constraint to a constraint with through-holes. This parameter change maintains the stress isolation function while enabling compatibility with standard silicon wafer fabrication processes, thereby reducing manufacturing difficulty and cost.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The constraint structure incorporates through-holes penetrating the silicon wafer, creating a porous configuration. This porous design reduces the constraint's stiffness, allowing it to flex and absorb thermal and mechanical stresses effectively, while maintaining ease of manufacture using standard semiconductor fabrication techniques.

Inventive Principle:
Principle #31Porous materials

2Measurement precision

If a glass constraint is used to limit stress transfer, then the sensor die accuracy is improved, but the manufacturing cost increases

Engineering Contradiction:
Improvesensor die accuracyVSAvoidmanufacturing cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent changes the material parameter from glass to silicon, and structurally from a solid constraint to a constraint with through-holes. This parameter change maintains the stress isolation function while enabling compatibility with standard silicon wafer fabrication processes, thereby reducing manufacturing cost.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The silicon wafer constraint can be manufactured using standard, cost-effective silicon fabrication processes that are already widely available in the semiconductor industry, replacing expensive glass constraints with a more economical silicon-based solution.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Ease of manufacture

If other suggested constraints are used, then the manufacturing cost is reduced, but the bonding strength decreases leading to early failure

Engineering Contradiction:
Improvemanufacturing costVSAvoidbonding strength
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent changes the material parameter to silicon, which has superior mechanical properties and bonding characteristics compared to alternative materials. This enables strong, reliable bonding to both the sensor die and substrate while maintaining cost-effectiveness through standard fabrication processes.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The constraint structure combines silicon material with a specific geometric configuration (through-holes), creating a composite structure that achieves both strong bonding capability and stress isolation function, resolving the contradiction between bonding strength and cost.

Inventive Principle:
Principle #40Composite materials

4Measurement precision

If a rigid constraint is used to limit stress transfer, then the sensor die accuracy is improved, but the constraint cannot accommodate thermal expansion differences

Engineering Contradiction:
Improvesensor die accuracyVSAvoidthermal expansion accommodation
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The through-holes create a porous constraint structure that reduces overall stiffness, allowing the constraint to flex and accommodate differential thermal expansion between the sensor die, constraint, and substrate while maintaining stress isolation benefits.

Inventive Principle:
Principle #31Porous materials

Solution Approach 2:

The constraint transitions from a rigid, static structure to a dynamic, flexible structure with through-holes that can deform elastically. This dynamic capability allows the constraint to adapt to thermal and mechanical stress variations while continuing to protect the sensor die.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The flexible constraint effectively limits stress transfer, enhancing the accuracy and consistency of the sensor die across a range of temperatures and applications, while maintaining strength and compatibility with various die attach materials.

Implementation Method 1

The flexible structure extends from the second side... providing flexibility to isolate the sensor die from stresses

Methodology Applied
Scientific EffectElastic deformation: Elasticity

Data Source

PatentUS11795052B2Constraint for a sensor assembly
Publication Date: 2023.10.24 TE CONNECTIVITY SOLUTIONS GMBH
  • US11795052B2 patent drawing
  • US11795052B2 patent drawing
  • US11795052B2 patent drawing

AI summary

A constraint for a sensor assembly includes a silicon wafer and a flexible structure. The silicon wafer has a first side, a second side opposite to the first side, and a passageway extending through the silicon wafer from the first side to the second side. The first side is a continuous planar surface except for the passageway. The flexible structure extends from the second side.