Electromagnetic Shielding Material Using Physical Silver Development

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Solution Overview

Problem

Existing electromagnetic wave shielding materials face challenges in achieving high transparency and conductivity while maintaining a low surface resistance, especially over higher frequency bands, and current preparation methods are costly and inefficient.

Innovation Solution

The development of an electromagnetic wave shielding material using physically developed metal silver as a catalytic nucleus, combined with a silver halide emulsion layer and a reducing agent, followed by metal plating using a DTR development method, to create a fine line pattern on a transparent substrate, enhancing both light transmittance and conductivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If a conductive metal thin film is formed by sputtering or ion plating to maintain transparency, then light transmittance is improved, but surface resistance becomes large and shielding effect decreases

Engineering Contradiction:
Improvelight transmittanceVSAvoidshielding effect
Core Design Contradiction:
Illumination intensityVSReliability

Solution Approach 1:

The invention changes the formation method parameter from physical vapor deposition (sputtering/ion plating) to chemical deposition (DTR development). This allows forming metal silver particles with controlled size and distribution that achieve low surface resistance (≤10 ohm/□) while maintaining high light transmittance (≥50%), resolving the contradiction between transparency and shielding effectiveness.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention uses a photographic emulsion layer as a template to copy the fine line pattern onto the substrate. The developed silver particles replicate the pattern geometry precisely, enabling formation of conductive paths with optimized geometry that achieve both transparency and low surface resistance simultaneously.

Inventive Principle:
Principle #26Copying

2Illumination intensity

If a fine line pattern with fine line width is provided to maintain transparency, then light transmittance is improved, but conductivity decreases and surface resistance increases

Engineering Contradiction:
Improvelight transmittanceVSAvoidconductivity
Core Design Contradiction:
Illumination intensityVSReliability

Solution Approach 1:

The invention changes the metal particle formation parameter from continuous thin film to discrete developed silver particles. This particle-based approach allows achieving low surface resistance (≤10 ohm/□) even with fine line patterns (≤10 μm width) by optimizing particle size (0.1-10 μm) and density, maintaining both transparency and conductivity.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If conventional metal plating methods are used to achieve low surface resistance, then conductivity is improved, but manufacturing cost increases and productivity decreases

Engineering Contradiction:
Improvesurface resistanceVSAvoidmanufacturing efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The invention uses the photographic emulsion layer itself as the pattern definition template, eliminating the need for separate photomask alignment and exposure steps. The DTR development process automatically forms the metal pattern where needed, achieving low surface resistance with a simplified, more productive manufacturing process.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The invention merges the pattern formation step and metal deposition step into a single DTR development process. The soluble silver complex salt forms and reduces directly on the developed silver particles from the emulsion layer, combining what would traditionally be separate steps into one operation, improving productivity while maintaining low surface resistance.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS7749620B2Electromagnetic wave shield material and process for producing the same
Publication Date: 2010.07.06 FUJIMORI KOGYO CO LTD

AI summary

The present invention is to provide an electromagnetic wave shielding material which comprises a transparent substrate and a fine line pattern formed thereon, wherein the fine line pattern comprises a metal plating film using a physically developed metal silver as a catalytic nucleus anda process for preparing an electromagnetic wave shielding material which comprises exposing a light-sensitive material having a physical development nuclei layer and a silver halide emulsion layer on a transparent substrate in this order, precipitating metal silver with an optional fine line pattern onto the physical development nuclei layer by physical development, then, removing a layer provided on the physical development nuclei layer, and subjecting to plating a metal with the use of the physically developed metal silver as a catalytic nucleus.