Structured Illumination Microscopy Pattern Angle Spatial Selection
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Solution Overview
Problem
Current structured illumination microscopy (SIM) systems face limitations in speed, reliability, and optical efficiency due to the need for mechanical rotation of diffraction gratings, which slows down imaging speed, affects stability, and increases costs, especially in high-throughput applications.
Innovation Solution
Implementing a multi-arm SIM imaging system with fixed, rotatably oriented diffraction gratings and a multiple beam splitter slide SIM imaging system with a single linear motion stage, eliminating the need for mechanical rotation and reducing the number of moving parts, thereby enhancing speed, reliability, and optical efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If mechanical rotation of diffraction gratings is used to control pattern orientation, then the system can achieve multiple pattern angles, but imaging speed decreases and reliability is affected
Solution Approach 1:
The patent divides the diffraction grating system into multiple fixed gratings (first diffraction grating, second diffraction grating) with predetermined orientations. Each grating is fixed at a specific angle (e.g., 0°, 60°, 120°) relative to the optical axis, eliminating the need for mechanical rotation. The system segments the pattern generation function across multiple stationary components rather than using a single rotating component.
Solution Approach 2:
Instead of rotating a single diffraction grating to change pattern angles, the patent inverts the approach by using multiple fixed gratings with different orientations. The pattern angle is selected by switching between fixed gratings rather than rotating a movable grating, thereby improving reliability and imaging speed.
2Adaptability or versatility
If mechanical rotation stages are used to mount diffraction gratings, then pattern orientation can be adjusted, but system complexity and cost increase
Solution Approach 1:
The patent extracts and removes the mechanical rotation stage from the system. Instead of using a rotation stage to mount and orient diffraction gratings, the system uses multiple fixed gratings with predetermined orientations. This eliminates the complex mechanical rotation mechanism while maintaining the ability to achieve multiple pattern angles through optical switching.
Solution Approach 2:
The patent replaces the mechanical rotation stage with an optical switching mechanism. The first optical switch and second optical switch control which fixed diffraction grating is active, substituting mechanical rotation with optical path selection. This reduces mechanical complexity while maintaining pattern orientation control.
3Illumination intensity
If multiple beam splitters are combined to generate fringe patterns, then interference patterns can be created, but modulation depth is reduced
Solution Approach 1:
The patent applies local quality by assigning specific functions to different optical components. Each fixed diffraction grating is optimized for its specific orientation, and optical switches are positioned to selectively route light through specific gratings. This localized optimization maintains high modulation depth for each pattern angle while enabling multiple orientations through the switching mechanism.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed systems improve imaging speed, reliability, and optical efficiency by eliminating mechanical rotation, allowing for higher throughput and reduced costs while maintaining high spatial resolution.
Implementation Method 1
a first beam splitter to split light emitted by the first light emitter to project a first plurality of fringes on a plane of a sample
Implementation Method 2
the interference between them can create a uniform, regularly-repeating fringe pattern
Data Source
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AI summary
The disclosure provides for structured illumination microscopy (SIM) imaging systems. In one set of implementations, a SIM imaging system may be implemented as a multi-arm SIM imaging system, whereby each arm of the system includes a light emitter and a beam splitter (e.g., a transmissive diffraction grating) having a specific, fixed orientation with respect to the system's optical axis. In a second set of implementations, a SIM imaging system may be implemented as a multiple beam splitter slide SIM imaging system, where one linear motion stage is mounted with multiple beam splitters having a corresponding, fixed orientation with respect to the system's optical axis. In a third set of implementations, a SIM imaging system may be implemented as a pattern angle spatial selection SIM imaging system, whereby a fixed two-dimensional diffraction grating is used in combination with a spatial filter wheel to project one-dimensional fringe patterns on a sample.