Masked Multi-Lane SIMD Memory Fault Handling via Fast-Slow Path Switching

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Solution Overview

Problem

Conventional approaches to executing masked multi-lane instructions in SIMD architectures often result in inefficient memory operations due to the need for lane-by-lane processing, especially when memory faults occur, which are rare in typical workloads, leading to increased processing effort and delay.

Innovation Solution

A processor employs a fast-path/slow-path execution mode for masked multi-lane instructions, initially attempting a single load or store operation for the entire memory block and switching to lane-by-lane processing only when a memory fault occurs, using microcode preambles or different decodings for efficient fault handling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If lane-by-lane load/store operations are performed for each enabled lane, then memory faults can be handled correctly, but the number of operations increases significantly reducing productivity

Engineering Contradiction:
Improvememory fault handling correctnessVSAvoidinstruction execution speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies dynamics by making the execution mode flexible and adaptive rather than fixed. The system dynamically selects between fast-path (speculative single load/store) and slow-path (lane-by-lane) execution modes based on whether memory faults occur. This allows the system to optimize for speed in normal conditions while maintaining correctness when faults occur, resolving the contradiction between productivity and reliability.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the operational parameters of the load/store operations based on execution mode. In fast-path mode, a single load/store operation is performed with relaxed correctness requirements (store-all-or-nothing semantics). In slow-path mode, lane-by-lane operations are performed with strict correctness requirements. This parameter change allows the system to achieve high productivity when possible while maintaining reliability when needed.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If a single load/store operation is performed for the entire memory block, then productivity is improved, but correctness cannot be guaranteed when memory faults occur

Engineering Contradiction:
Improveinstruction execution speedVSAvoidmemory fault handling correctness
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system dynamically adjusts the load/store operation strategy based on execution mode. In fast-path mode, a single load/store operation is used to maximize productivity. In slow-path mode, the system switches to lane-by-lane operations to ensure correctness when memory faults occur. This dynamic adaptation resolves the contradiction between productivity and reliability.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent prepares for potential memory faults by having the slow-path lane-by-lane execution mechanism ready as a backup. The fast-path execution assumes no faults will occur and optimizes for speed, while the slow-path serves as a cushioning mechanism to handle faults correctly when they occur, maintaining reliability without sacrificing normal-speed productivity.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Productivity

If mask is provided to address generation unit for lane-by-lane processing, then memory operations are optimized for enabled lanes, but device complexity increases due to coordination requirements

Engineering Contradiction:
Improvememory operation efficiencyVSAvoidcoordination between integer unit and floating point unit
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent extracts the mask handling complexity from the fast-path execution by using a store-all-or-nothing semantics approach. The mask is effectively taken out of the address generation process in fast-path mode, allowing a single load/store operation without complex coordination. The mask is only used in slow-path mode when lane-by-lane processing is required, thus eliminating the complexity for the common fast-path case while maintaining correctness when needed.

Inventive Principle:
Principle #2Taking out (Extraction)

4Productivity

If fast-path execution is used assuming no memory faults, then productivity is maximized, but the system cannot handle memory faults correctly

Engineering Contradiction:
Improveinstruction execution speedVSAvoidmemory fault handling capability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system dynamically switches between fast-path and slow-path execution modes based on memory fault detection. The fast-path assumes no faults and maximizes productivity, while the slow-path handles faults correctly. The exception handler enables this dynamic switching, allowing the system to achieve both high productivity in normal conditions and reliable fault handling when needed.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The exception handler acts as an intermediary that mediates between the fast-path execution (which assumes no faults) and the slow-path execution (which handles faults correctly). When a memory fault occurs during fast-path execution, the exception handler intercepts the fault and triggers slow-path re-execution, thus bridging the gap between productivity optimization and reliability assurance.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS11847463B2Masked multi-lane instruction memory fault handling using fast and slow execution paths
Publication Date: 2023.12.19 ADVANCED MICRO DEVICES INC
  • US11847463B2 patent drawing
  • US11847463B2 patent drawing
  • US11847463B2 patent drawing

AI summary

A processor includes a load/store unit and an execution pipeline to execute an instruction that represents a single-instruction-multiple-data (SIMD) operation, and which references a memory block storing operand data for one or more lanes of a plurality of lanes and a mask vector indicating which lanes of a plurality of lanes are enabled and which are disabled for the operation. The execution pipeline executes an instruction in a first execution mode unless a memory fault is generated during execution of the instruction in the first execution mode. In response to the memory fault, the execution pipeline re-executes the instruction in a second execution mode. In the first execution mode, a single load operation is attempted to access the memory block via the load/store unit. In the second execution mode, a separate load operation is performed by the load/store unit for each enabled lane of the plurality of lanes prior to executing the SIMD operation.