Simultaneous Epi Growth in Depth-Differentiated SOI Cavities

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Solution Overview

Problem

Conventional optoelectronic devices face challenges in optimizing coupling efficiency between passive and active waveguides, particularly with complex epi stacks, which increases the number of fabrication steps and can result in device inefficiencies due to high temperature cleaning processes damaging previous epi growths.

Innovation Solution

A method of fabricating optoelectronic components by depositing a multistack epi layer simultaneously into cavities of different depths within a silicon-on-insulator substrate, minimizing damage from high-temperature cleaning steps and aligning epi layers for optimal coupling efficiency, with optional features including doped and undoped layers, III-V materials, and quantum wells or dots for specific functions like electro-absorption modulators and laser diodes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If multiple separate epi growth steps are used to create complex epi stacks, then the coupling efficiency between waveguides is improved, but the number of fabrication steps increases and high temperature cleaning processes damage previous epi growths

Engineering Contradiction:
Improvecoupling efficiencyVSAvoidnumber of fabrication steps
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent combines multiple separate epi growth steps into a single simultaneous epi growth process. Multiple epi layers with different compositions (e.g., SiGe layers with different germanium concentrations) are grown at the same time in different cavity regions, eliminating the need for repeated cleaning and regrowth cycles. This reduces fabrication complexity while maintaining the ability to create complex epi stacks with optimized coupling efficiency between waveguides.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent segments the substrate into multiple cavity regions with different depths, allowing each region to receive a tailored epi layer composition during simultaneous growth. By etching cavities to different depths before the single epi growth step, the process creates spatially differentiated epi structures without requiring multiple sequential growth cycles, thus reducing fabrication steps while achieving precise coupling optimization.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If high temperature cleaning processes are used between epi growth steps, then the quality of epi layers is improved, but previous epi growths are damaged

Engineering Contradiction:
Improveepi layer qualityVSAvoiddamage to previous epi growths
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent performs preliminary preparation by etching multiple cavity regions to different depths before the epi growth process. This preliminary structuring allows subsequent simultaneous epi growth to proceed without intermediate high temperature cleaning steps, as the depth-differentiated cavities enable direct formation of the desired epi stack architecture in a single growth cycle, avoiding thermal damage to previously grown layers.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent merges multiple epi growth operations into a single simultaneous growth process. By growing multiple epi layers with different compositions at the same time in different cavity regions, the process eliminates intermediate high temperature cleaning steps that would otherwise be required between separate growth cycles, thereby preventing thermal damage while maintaining epi layer quality.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If complex epi stacks are deposited and patterned, then the performance of optoelectronic devices is optimized, but the number of fabrication steps increases

Engineering Contradiction:
Improvedevice performanceVSAvoidnumber of fabrication steps
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent combines the deposition of multiple complex epi layers into a single simultaneous epi growth step. By using depth-differentiated cavity regions to guide the formation of different epi stack compositions in different areas, the process achieves complex device structures without requiring multiple sequential deposition and patterning cycles, thus maintaining device performance while reducing fabrication step count.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent applies local quality by creating depth-differentiated cavity regions that receive different epi layer compositions during simultaneous growth. Each cavity region is tailored to produce the specific epi stack structure needed for optimal device performance in that location, while the entire structure is formed in a single growth step, avoiding the need for repeated patterning operations.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces the number of fabrication steps, minimizes damage from high-temperature cleaning, and optimizes coupling efficiency by aligning epi layers within the same level, enhancing the performance of optoelectronic devices such as electro-absorption modulators and laser diodes.

Implementation Method 1

depositing a multistack epi layer simultaneously into a first cavity and a second cavity... the multistack epi layer comprising a first multistack portion comprising a first active region and a second multistack portion comprising a second active region

Methodology Applied
Scientific EffectEpitaxial growth: Epitaxy

Implementation Method 2

Waveguides on a semiconductor substrate are typically configured to guide a light signal through an upper layer of the substrate by total internal reflection

Methodology Applied
Scientific EffectTotal internal reflection: Total Internal Reflection

Data Source

PatentUS11075498B2Method of fabricating an optoelectronic component
Publication Date: 2021.07.27 ROCKLEY PHOTONICS LTD
  • US11075498B2 patent drawing
  • US11075498B2 patent drawing
  • US11075498B2 patent drawing

AI summary

A method of fabricating an optoelectronic component within a silicon-on-insulator substrate, the method comprising: providing a silicon-on-insulator (SOI) substrate, the SOI substrate comprising a silicon base layer, a buried oxide (BOX) layer on top of the base layer, and a silicon device layer on top of the BOX layer; etching a first cavity region into the SOI substrate and etching a second cavity region into the SOI substrate, the first cavity region having a first depth and the second cavity region having a second depth, the second depth being greater than the first depth; depositing a multistack epi layer into the first and the second cavity regions simultaneously, the multistack epi layer comprising a first multistack portion comprising a first active region and a second multistack portion comprising a second active region.