Single-ADC Difference Conversion for Higher-Resolution Sensing

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Solution Overview

Problem

Existing A/D converters face challenges in achieving high accuracy with a single A/D conversion circuit, as most high-accuracy implementations require two A/D conversion circuits, such as Coarse and Fine ADCs, which introduce errors and complexity.

Innovation Solution

The proposed A/D converter configuration includes a D/A conversion circuit, a difference output circuit, and an A/D conversion circuit, where the control circuit outputs two different DAC input digital values to perform A/D conversions, allowing the A/D converter to achieve higher accuracy by performing conversions based on the difference between the input signal and DAC output signals, thereby increasing resolution without the need for two separate A/D conversion circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If two A/D conversion circuits (Coarse ADC and Fine ADC) are used to achieve high accuracy, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
ImproveA/D conversion accuracyVSAvoidnumber of A/D conversion circuits
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the A/D conversion process into multiple stages with different DAC input digital values, where each stage processes a portion of the conversion task. Instead of using multiple parallel A/D conversion circuits, the single circuit performs sequential conversions with varying DAC inputs, dividing the high-accuracy conversion task into manageable segments that reduce overall system complexity while maintaining precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs periodic action by repeatedly performing A/D conversion operations with different DAC input digital values (first, second, third values). The control circuit systematically varies the DAC input across multiple conversion cycles, allowing the single A/D conversion circuit to accumulate precision through repeated measurements with different reference levels, effectively replacing the need for multiple simultaneous circuits.

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If multiple A/D conversion circuits are used to improve accuracy, then measurement precision is improved, but manufacturing precision requirements increase

Engineering Contradiction:
ImproveA/D conversion accuracyVSAvoidcircuit matching accuracy
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent merges the functions of multiple A/D conversion circuits into a single circuit by combining the reference DAC functionality with the conversion process. Instead of requiring precise matching between separate Coarse ADC and Fine ADC circuits, the invention uses one unified A/D conversion circuit that references its own DAC output, eliminating inter-circuit matching errors and reducing manufacturing precision requirements.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent implements feedback by using the DAC output signal as a reference for the A/D conversion process. The control circuit adjusts DAC input digital values based on previous conversion results, creating a feedback loop that continuously refines the measurement. This self-referencing approach reduces sensitivity to manufacturing variations compared to systems requiring precise matching between independent circuits.

Inventive Principle:
Principle #23Feedback

3Device complexity

If a single A/D conversion circuit is used to simplify design, then device complexity is reduced, but measurement precision deteriorates

Engineering Contradiction:
Improvenumber of A/D conversion circuitsVSAvoidA/D conversion accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent adds a temporal dimension to the single A/D conversion circuit by performing multiple conversion operations with different DAC input values over time. Instead of relying on spatial multiplication (multiple parallel circuits), the invention uses time-multiplexed conversions with varying reference levels, effectively increasing measurement precision through dimensional expansion of the conversion process rather than through circuit multiplication.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the DAC input digital value parameter across multiple conversion operations. By systematically varying this parameter (first value, second value, third value) and using the results to calculate the final high-precision output, the single A/D conversion circuit achieves accuracy comparable to multiple circuits. The precision improvement comes from parameter variation and mathematical synthesis rather than from additional hardware.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11916560B2A/D converter, digital-output temperature sensor, circuit device, and oscillator
Publication Date: 2024.02.27 SEIKO EPSON CORP
  • US11916560B2 patent drawing
  • US11916560B2 patent drawing
  • US11916560B2 patent drawing

AI summary

The A/D converter includes a D/A conversion circuit configured to perform a D/A conversion on a DAC input digital value to output a DAC output signal, a difference output circuit for outputting difference signals based on a difference between the input signal and the DAC output signal, an A/D conversion circuit for performing an A/D conversion on the difference signals to output an ADC output digital value, and a control circuit for outputting the DAC input digital value based on the ADC output digital value. The control circuit outputs a first DAC input digital value and a second DAC input digital value different from the first DAC input digital value, and obtains ADC result data based on a first ADC output digital value obtained in accordance with the first DAC input digital value, a second ADC output digital value obtained in accordance with the second DAC input digital value, and the DAC input digital value.