Single Crystal Si Thin Film Transistors for LCD Contrast

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Solution Overview

Problem

Conventional single crystal TFTs in LCDs have thick silicon layers, leading to high photosensitivity and current leakage, which result in low display contrast ratios and image retention, especially in ambient light or bright backlighting conditions.

Innovation Solution

The use of thin film layers of essentially single crystal silicon with a thickness between 100 nm and 200 nm in pixel transistors, along with corresponding pixel and common electrodes, reduces photosensitivity and current leakage, enhancing display contrast and performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional single crystal TFTs with thick silicon layers are used, then high electron mobility and high pixel density are achieved, but photosensitivity increases causing current leakage and low display contrast ratio

Engineering Contradiction:
Improveelectron mobilityVSAvoidphotosensitivity
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies parameter changes by reducing the silicon layer thickness from conventional thick layers (300 nm or greater) to a thin film layer (100 nm to 200 nm). This parameter change simultaneously maintains high electron mobility inherent to single crystal silicon while reducing photosensitivity and current leakage, thereby resolving the technical contradiction between reliability and photosensitivity.

Inventive Principle:
Principle #35Parameter changes

2Power

If thick silicon layers are used in pixel TFTs, then sufficient current driving capability is achieved, but current leakage increases due to photosensitivity

Engineering Contradiction:
Improvecurrent driving capabilityVSAvoidcurrent leakage
Core Design Contradiction:
PowerVSObject-generated harmful factors

Solution Approach 1:

The patent changes the thickness parameter of the silicon layer to 100 nm to 200 nm, which reduces the photosensitive volume and thereby reduces current leakage while maintaining adequate current driving capability for the display application.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent applies local quality by creating lightly doped drain (LDD) regions adjacent to the gate electrode. These LDD regions have different doping concentrations than the source and drain regions, providing localized control over current characteristics and reducing hot carrier effects and current leakage in critical areas.

Inventive Principle:
Principle #3Local quality

3Ease of manufacture

If amorphous silicon TFTs are used, then large-size LCD panels can be fabricated, but transistor performance is poor due to low electron mobility

Engineering Contradiction:
Improvefabrication capabilityVSAvoidtransistor performance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent employs composite materials by combining single crystal silicon with insulating layers (such as silicon dioxide or silicon nitride) to form a thin film structure. This composite approach enables the fabrication of large-size panels while maintaining the high electron mobility and superior transistor performance of single crystal silicon.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent changes the material state from amorphous silicon to single crystal silicon in thin film form, fundamentally altering the electronic properties while maintaining compatibility with LCD fabrication processes. This parameter change in crystal structure enables high electron mobility (>100 cm²/Vs) necessary for high-performance displays.

Inventive Principle:
Principle #35Parameter changes

4Reliability

If polycrystalline silicon TFTs are used, then electron mobility is improved compared to amorphous silicon, but crystalline defects reduce performance below single crystal levels

Engineering Contradiction:
Improveelectron mobilityVSAvoidcrystalline defects
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent changes the crystalline structure parameter from polycrystalline to single crystal, eliminating grain boundaries and crystalline defects. This is achieved through specific deposition or recrystallization processes that produce a continuous single crystal structure in thin film form, thereby maximizing electron mobility and eliminating the performance limitations of polycrystalline silicon.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8072406B2Display system with single crystal Si thin film transistors
Publication Date: 2011.12.06 KOPIN CORP
  • US8072406B2 patent drawing
  • US8072406B2 patent drawing
  • US8072406B2 patent drawing

AI summary

A liquid crystal display comprises a display panel that includes at least one pixel transistor, at least one pixel electrode in electrical communication with the pixel transistor, at least one common electrode, and a liquid crystal material between the pixel electrode and the common electrode. The pixel transistor includes a thin film layer of essentially single crystal silicon that has a thickness in a range of between about 100 nm and about 200 nm. The pixel electrode has a thickness in a range of between about 5 nm and about 20 nm. The common electrode has a thickness of between about 50 nm and about 200 nm.