Single Event Transient Measurement Chain for Intrinsic Pulse Capture
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Solution Overview
Problem
Existing methods for evaluating Single Event Transient (SET) performance of logic circuits are prone to reduced accuracy due to the difficulty in measuring baseline and cumulative SET curves, requiring multiple stages and complex data extraction processes.
Innovation Solution
A circuit and method that directly measures SET performance by using a measurement chain with parallel pairs of SR latches and dual-input inverters, allowing a pulse signal to propagate only when both latches are active, enabling direct detection and latching of SET events, thereby improving measurement accuracy and reducing testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If baseline SET and cumulative SET are measured separately using two chains of SR latches, then SET performance can be evaluated, but measurement precision deteriorates due to reduced accuracy in measuring both curves and complex data extraction
Solution Approach 1:
The patent combines the baseline SET measurement chain and cumulative SET measurement chain into a single integrated measurement chain. This merging eliminates the need for separate measurements and complex curve subtraction, directly providing accurate intrinsic SET performance data while reducing device complexity and measurement uncertainty.
Solution Approach 2:
The patent extracts and eliminates the need for separate baseline SET measurement by directly measuring only the intrinsic SET performance of the target circuit. This extraction removes the unnecessary complexity of measuring and subtracting baseline curves, focusing only on the relevant SET performance data.
2Productivity
If two separate measurement chains are used for baseline and cumulative SET measurements, then SET performance can be determined, but loss of time increases due to multiple measurements and data processing
Solution Approach 1:
By merging the measurement functions into a single chain, the patent enables simultaneous acquisition of all necessary data in one measurement process, eliminating the sequential time required for separate baseline and cumulative measurements and their subsequent data processing.
Solution Approach 2:
The measurement chain is pre-configured with the necessary logic circuitry (AND gate, SR latches) to directly extract intrinsic SET performance during the measurement process itself, rather than requiring post-measurement data processing and curve subtraction operations.
3Measurement precision
If a single measurement chain with parallel SR latches is used for direct SET measurement, then measurement precision improves, but device complexity increases due to additional logic circuitry
Solution Approach 1:
The parallel SR latches and associated logic circuitry serve multiple functions: they detect SET events, differentiate between baseline and cumulative SET, and directly extract intrinsic SET performance. This multi-functionality justifies the additional circuitry by eliminating the need for separate measurement chains and complex data processing systems.
4Ease of operation
If baseline SET and cumulative SET are measured separately, then SET performance can be evaluated, but ease of operation deteriorates due to complex measurement and data extraction processes
Solution Approach 1:
The patent extracts and eliminates the complex data extraction process by directly measuring only the intrinsic SET performance. This removes the need for operators to perform complex curve subtraction and data processing operations, significantly simplifying the measurement process.
Data Source
AI summary
A circuit and method of directly measuring the Single Event Transient (SET) performance of a combinatorial circuit includes a measurement chain. The measurement chain includes a plurality of cells, each in turn including a pair of SR latches, a dual-input inverter, and a target. During measurement and testing, the targets are irradiated, and a pulse signal caused by an SET event is allowed to propagate through the measurement chain only if the pair of SR latches are active at the same time. The pulse signal is latched by the measurement chain, thus allowing the presence of an SET event to be detected.