Single Flange Waveguide Structure for ATE Signal Integrity

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Solution Overview

Problem

Conventional Automatic Test Equipment (ATE) systems experience signal loss at high frequencies due to elongated signal paths and large waveguide flanges, which limit the packing density of waveguides and degrade signal integrity.

Innovation Solution

The use of customizable waveguides integrated within a single structure with a shared flange connection allows for tight packing and close proximity to patch antennas, minimizing signal path length and reducing signal loss by using a single flange for multiple waveguides, which can be made of plastic or metal and mounted on a PCB with fastening agents.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional waveguide flanges are used to mate waveguides to tester electronics, then the waveguides can be securely connected, but the large size of these flanges limits the packing density of multiple waveguides and increases signal path length

Engineering Contradiction:
Improvesignal integrityVSAvoidwaveguide flange size
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent combines multiple waveguide flanges into a single shared flange structure that serves multiple waveguides simultaneously. This merging approach reduces the total area occupied by flanges and allows waveguides to be positioned closer together, directly resolving the contradiction between secure connection reliability and compact packing density.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The shared flange structure performs multiple functions: it provides secure mechanical connection for multiple waveguides simultaneously, serves as a common mounting interface to the PCB, and enables tight packing of waveguides. This multi-functionality allows a single component to address both connection reliability and space efficiency.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If the signal path is extended to reach tester diagnostic systems, then testing capability is achieved, but signal strength is lost particularly at millimeter frequencies

Engineering Contradiction:
Improvetesting capabilityVSAvoidsignal strength
Core Design Contradiction:
Adaptability or versatilityVSLoss of energy

Solution Approach 1:

The patent segments the signal path into distinct functional sections: a compact waveguide array section with shared flange for high-frequency signal transmission, and separate connection sections for interfacing with tester electronics. This segmentation allows the critical high-frequency portion to be minimized in length while maintaining overall testing capability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from conventional linear signal path arrangement to a three-dimensional compact waveguide array configuration. By utilizing vertical and lateral spacing efficiently in 3D space, the signal path length is minimized while maintaining all necessary testing functions and connections.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Area of stationary object

If multiple waveguides are positioned close together, then space efficiency is improved, but conventional flange dimensions prevent close mounting of adjacent waveguides

Engineering Contradiction:
Improvespace utilizationVSAvoidwaveguide mounting
Core Design Contradiction:
Area of stationary objectVSEase of manufacture

Solution Approach 1:

The patent merges multiple individual waveguide-flange assemblies into a single integrated structure where multiple waveguides share one common flange. This eliminates the need for separate large flanges for each waveguide, enabling close mounting while maintaining manufacturing feasibility through a unified design approach.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS10381707B2Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
Publication Date: 2019.08.13 ADVANTEST CORP
  • US10381707B2 patent drawing
  • US10381707B2 patent drawing
  • US10381707B2 patent drawing

AI summary

Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.