Single Ion Trap Scans for Higher Precursor Ion Utilization
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Solution Overview
Problem
Conventional mass spectrometers face inefficiencies in precursor ion conversion to product ions during scans, leading to low detection rates and resource constraints in miniature ion trap systems.
Innovation Solution
Implementing multiple precursor ion scans on a single ion population within a single ion trap, allowing for various permutations such as sequential or simultaneous scans with neutral loss and product ion scans, to maximize information extraction from limited resources.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional precursor ion scans are performed in a single ion trap, then the instrument structure remains simple, but the conversion efficiency of precursor ions to product ions is low
Solution Approach 1:
The patent implements multiple sequential precursor ion scans on the same ion population within a single ion trap, performing periodic excitation and detection cycles. This allows the system to extract multiple spectra from the same ions through repeated scanning at different secular frequencies, thereby improving precursor ion utilization efficiency without adding physical components
Solution Approach 2:
The single ion trap is designed to perform multiple functions: it can simultaneously conduct precursor ion scans, product ion scans, and neutral loss scans by adjusting excitation frequencies. The same physical trap structure serves as both the ion confinement region and the analysis chamber for multiple scan types, eliminating the need for separate trap structures
2Loss of information
If multiple precursor ion scans are performed on the same ion population, then information extraction is maximized, but the scan time for each individual scan is reduced
Solution Approach 1:
The system performs continuous sequential scans on the same ion population without allowing the ions to leave the trap between scans. By maintaining the ion population in the trap and immediately performing the next scan at a different secular frequency, the system ensures continuous utilization of the ion population, maximizing information extraction while minimizing idle time
Solution Approach 2:
The system pre-configures multiple scan parameters and secular frequencies before initiating the scan sequence. The ion population is first trapped and accumulated, then multiple scans are rapidly executed in predetermined sequence without intermediate ion injection or trap reconfiguration, thereby reducing overhead time and maximizing the information obtained per unit time
3Speed
If conventional scan rates are used (thousands of Dalton/charge per second), then scan speed is maintained, but the conversion of precursor ions to detected product ions remains low (5-10%)
Solution Approach 1:
The patent changes the excitation frequency parameter to match different secular frequencies of product ions during sequential scans. By tuning the excitation frequency to resonate with specific product ion masses at different time points, the system achieves selective fragmentation and detection at conventional scan rates, thereby improving conversion efficiency without sacrificing scan speed
Solution Approach 2:
The system dynamically adjusts the excitation frequency during the scan sequence to track the secular frequencies of different product ions. This dynamic frequency modulation allows the single ion trap to adaptively optimize fragmentation conditions for different masses while maintaining conventional scan rates, resolving the contradiction between speed and conversion efficiency
Data Source
AI summary
The invention generally relates to systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap. In certain aspects, the invention provides systems including a mass spectrometer having a single ion trap, and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply at least one of the following ion scans to a single ion population in the single ion trap: multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.