Single-Phase High Entropy Silicide Thin Films for Phase-Pure Microelectronics

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Solution Overview

Problem

Current high entropy silicide materials, such as (MoNbTaTiW)Si2 and (MoNbTaCrW)Si2, exhibit multiple phases and secondary oxide or intermetallic phases, limiting their application in microelectronics and requiring a deeper understanding of phase formation and evolution, while previous work has only considered bulk samples, necessitating the development of thin film fabrication methods for integrated circuit and device applications.

Innovation Solution

A method involving the deposition of metal layers onto a silicon substrate followed by heat treatment to form single-phase high entropy silicide materials, using the CALculation of PHAse Diagrams (CALPHAD) approach to identify candidate compositions like (CrMoTa)Si2 and (CrMoTaVNb)Si2, and synthesizing them via electron beam evaporation and heat treatment in vacuum to facilitate solid-state reactions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If mechanical alloying followed by spark plasma sintering is used to synthesize high entropy silicides, then bulk samples can be produced, but multiple phases and secondary oxide or intermetallic phases form

Engineering Contradiction:
Improvebulk sample productionVSAvoidphase purity
Core Design Contradiction:
Quantity of substanceVSStability of the object's composition

Solution Approach 1:

The patent changes the synthesis parameters by using physical vapor deposition (electron beam evaporation) instead of mechanical alloying, and employs a two-step process with controlled heat treatment temperatures (900-1100°C) and times (30-60 minutes) to achieve single-phase formation. This parameter optimization resolves the phase purity issue while maintaining bulk sample production capability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent performs synthesis in vacuum environment using electron beam evaporation, which prevents oxide formation. The inert vacuum atmosphere eliminates oxygen exposure during deposition and heat treatment, thereby preventing secondary oxide phases from forming while still enabling bulk sample production

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

2Reliability

If bulk samples are used for high entropy silicide research, then phase formation can be studied, but applications in integrated circuits and devices are limited

Engineering Contradiction:
Improvephase formation understandingVSAvoidapplication range
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent transitions from bulk sample synthesis to thin film fabrication by using physical vapor deposition techniques. This dimensional change enables the material to be applied in integrated circuits and devices while maintaining single-phase composition through controlled deposition and heat treatment processes

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Manufacturing precision

If conventional alloy design based on single principal element is used, then material properties are well-understood, but compositional space exploration is limited

Engineering Contradiction:
Improvematerial property controlVSAvoidcompositional space
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The patent employs composite material design by combining five or more principal elements in near-equiatomic ratios to create high entropy silicides. This composite approach with multiple principal elements (e.g., (CrMoTaVNb)Si2) explores vast compositional space while achieving single-phase formation and desired material properties through entropy stabilization

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The approach successfully forms single-phase high entropy silicide thin films with a C40 hexagonal crystal structure, validating CALPHAD predictions and enabling their application in microelectronics, compatible with industry-standard microelectronics processing techniques.

Implementation Method 1

synthesizing them via electron beam evaporation and heat treatment in vacuum

Methodology Applied
Scientific EffectElectron beam evaporation: Evaporation

Implementation Method 2

heat treating the multilayer film at a sufficient temperature to promote interdiffusion of the metal layer and the silicon substrate

Methodology Applied
Scientific EffectInterdiffusion: Diffusion

Implementation Method 3

heat treating the multilayer film at a sufficient temperature to promote interdiffusion

Methodology Applied
Scientific EffectHeat treatment: Heat Treatment

Implementation Method 4

heat treatment in vacuum, so as to facilitate the solid-state reaction and formation of a single-phase

Methodology Applied
Scientific EffectSolid-state reaction: Phase Change

Data Source

PatentUS20230407460A1Single phase high entropy intermetallics and method for manufacturing
Publication Date: 2023.12.21 RGT UNIV OF CALIFORNIA
  • US20230407460A1 patent drawing
  • US20230407460A1 patent drawing
  • US20230407460A1 patent drawing

AI summary

A method of forming a single-phase high entropy silicide includes depositing at least two metal layers onto a silicon substrate to form a multilayer film; and heat treating the multilayer film to promote interdiffusion of the metal layer and the silicon substrate to form a single-phase silicide material.