Single-Photon Detector Layer Structure for Edge Breakdown Control

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Solution Overview

Problem

Conventional methods for making single-photon detectors, such as SPADs, face challenges including premature edge breakdown, complex fabrication processes, and low yield, especially when forming large detector arrays.

Innovation Solution

A method involving the growth of an epitaxial multi-layer structure with a buffer layer, absorption layer, transition layer, field control charge layer, multiplication layer, inversion layer, migration layer, and Ohmic contact layer, followed by a single diffusion process to form a curved diffusion region and mesa structure, and the formation of p-type and n-type electrodes, which simplifies the fabrication and reduces premature edge breakdown.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional methods (two diffusion processes) are used to make SPAD detectors, then premature edge breakdown is mitigated, but manufacturing complexity increases and yield decreases

Engineering Contradiction:
Improvepremature edge breakdown mitigationVSAvoidfabrication process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent combines multiple diffusion processes into a single diffusion process by designing a specific epitaxial structure with multiple layers (buffer layer, absorption layer, transition layer, field control charge layer, multiplication layer, intrinsic layer) that are sequentially formed. This merging reduces fabrication complexity while maintaining the ability to mitigate premature edge breakdown through the field control charge layer and optimized layer structure.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent segments the detector structure into distinct functional layers with specific doping concentrations and thicknesses. The field control charge layer is segmented from other layers and positioned specifically to control the electric field distribution, allowing premature edge breakdown mitigation without requiring multiple diffusion processes. Each layer is optimized independently for its specific function.

Inventive Principle:
Principle #1Segmentation

2Reliability

If conventional methods (two diffusion processes) are used to make SPAD detectors, then premature edge breakdown is mitigated, but manufacturing yield decreases

Engineering Contradiction:
Improvepremature edge breakdown mitigationVSAvoidmanufacturing yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent merges multiple diffusion steps into a single diffusion process by designing an epitaxial structure where the field control charge layer and other layers are sequentially formed in one continuous process. This reduces the number of process steps, increases manufacturing yield, and maintains reliability through the optimized layer structure that controls electric field distribution.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent performs preliminary actions by pre-designing the epitaxial layer structure with specific doping concentrations and thicknesses before the single diffusion process. The field control charge layer is pre-positioned and pre-doped to the appropriate concentration, so that a single subsequent diffusion process can complete the structure formation without requiring multiple diffusion steps, thereby increasing yield.

Inventive Principle:
Principle #10Preliminary action

3Power

If SPAD operates above breakdown threshold voltage (Geiger mode), then high gain is achieved, but premature edge breakdown occurs

Engineering Contradiction:
ImprovegainVSAvoidpremature edge breakdown
Core Design Contradiction:
PowerVSReliability

Solution Approach 1:

The patent applies local quality by creating a field control charge layer with specific doping concentration (1×10^16 to 1×10^18 atoms/cm³) and thickness (100 nm to 1 µm) at a specific position within the detector structure. This localized doping creates a controlled electric field distribution that prevents premature edge breakdown at high operating voltages while maintaining high gain in Geiger mode. The transition layer and multiplication layer are also optimized locally for their specific functions.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces the complexity of fabricating single-photon detectors, increases yield, and is suitable for forming detector arrays with improved reliability and efficiency, mitigating premature edge breakdown and dark count issues.

Implementation Method 1

Light is composed of photons which are the smallest unit of electromagnetic radiation. A single photon in the visible or near infra red range of the electromagnetic spectrum has approximately 10-19 joules of energy, and cannot be effectively detected with conventional photodetectors.

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

SPADs operates via impact ionization which causes an avalanche current to develop. In terms of practicality, SPADs functions in the visible and near infra red range of the electromagnetic spectrum, has advantages such as high gain, low noise to gain ratio, low power consumption, and small size

Methodology Applied
Scientific EffectImpact ionization: Avalanche Breakdown

Data Source

PatentUS20250015222A1Method for Making Single-Photon Detector, Single-Photon Detector Thereof, and Single-Photon Array Thereof
Publication Date: 2025.01.09 QUANZHOU SANAN OPTICAL COMM TECH CO LTD
  • US20250015222A1 patent drawing
  • US20250015222A1 patent drawing
  • US20250015222A1 patent drawing

AI summary

A method of making a single-photon detector includes growing an epitaxial multi-layer structure that includes a buffer layer, an absorption layer, a transition layer, a field control charge layer, a multiplication layer, an inversion layer, a migration layer, a window layer, and an Ohmic contact layer sequentially on a substrate. A curved diffusion region is formed in the window layer and the Ohmic contact layer via a diffusion process. A mesa structure is formed by etching the epitaxial multi-layer. A light input window is formed on the substrate. A p-type electrode is formed on the Ohmic contact layer, and an n-type electrode is formed on the substrate. The inversion layer provides supplementary regulation of an electric field distribution that is regulated by the field control charge layer. A single-photon detector made from the method, and a single-photon detector array made with a multitude of the single-photon detectors are also provided.