Single-Sampler PAM3 Error Sampling for Lower Power

The patent combines multiple sampling circuits into a single sampling circuit that uses clock edge alignment technology. Instead of using separate sampling circuits for different clock edges, the invention integrates their functions into one circuit that sequentially samples on both rising and falling edges of the clock signal, thereby reducing power consumption while maintaining sampling reliability.

The single sampling circuit is designed to perform multiple functions: it samples PAM3 error signals on both rising and falling clock edges, and can handle multiple sampling tasks sequentially. This multi-functional design eliminates the need for multiple dedicated sampling circuits, reducing overall power consumption while maintaining comprehensive sampling coverage.

The patent employs periodic sampling action by aligning sampling operations with clock edges. Instead of continuous over-sampling, the circuit performs sampling at specific periodic intervals synchronized with the clock signal's rising and falling edges. This periodic approach maintains sampling accuracy while reducing the harmful kickback noise associated with excessive sampling operations.

The sampling circuit performs preliminary alignment with clock edges before actual sampling occurs. By pre-synchronizing the sampling timing with the clock signal transitions, the circuit ensures accurate sampling at the optimal moments while avoiding unnecessary sampling operations that would generate kickback noise.