Single Test Button for Multi-Pole Arc-Fault Circuit Breaker
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Solution Overview
Problem
Current multi-pole arc-fault circuit breakers are unnecessarily complex, requiring multiple test buttons or multiple positions on a single test button, which increases manufacturing costs, design complexity, and microcontroller size and heat generation due to additional hardware components and I/O inputs.
Innovation Solution
A multiple pole arc-fault circuit breaker design featuring a single test button that sends a single test signal to initiate electrical tests for both pole assemblies, using a microprocessor to perform tests and actuate trip mechanisms upon successful completion, reducing hardware requirements and design complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple test buttons or multiple positions on a single test button are used, then each pole can be tested individually, but the device complexity and manufacturing cost increase
Solution Approach 1:
The patent combines multiple test button functions into a single test button with a single position. The microprocessor controls a single pair of contacts that are used to test all pole assemblies sequentially, eliminating the need for multiple test buttons or multiple positions on one button.
Solution Approach 2:
The single test button serves multiple functions by testing all pole assemblies through a universal testing mechanism. The microprocessor coordinates the testing of each pole assembly using the same test button and contact pair, making the test button universal for all poles.
2Reliability
If multiple test buttons are used, then each pole can be tested, but the microcontroller size and cost increase due to additional I/O inputs
Solution Approach 1:
The patent merges multiple I/O inputs into a single I/O input by using one test button that connects to a single pair of contacts. The microprocessor receives test signals through this single connection point, reducing the required pin count.
Solution Approach 2:
The microprocessor acts as an intermediary that coordinates the testing of multiple pole assemblies through a single test button. It manages the sequential testing process and controls the trip mechanisms, eliminating the need for direct connections to each test button.
3Adaptability or versatility
If a larger microcontroller is used to support multiple test buttons, then more I/O inputs are available, but heat generation increases
Solution Approach 1:
The patent extracts the excess I/O input requirements by using a minimal configuration of test buttons and contacts. This allows the use of a smaller microcontroller that generates less heat while still providing full testing capability for all pole assemblies.
4Reliability
If multiple test buttons are used, then comprehensive testing is possible, but manufacturing cost increases due to additional hardware components
Solution Approach 1:
The patent merges multiple hardware components (test buttons, mounting hardware, coupling components) into a single test button assembly. This reduction in component count directly lowers manufacturing costs while maintaining comprehensive testing capability through microprocessor control.
Data Source
AI summary
A multiple pole arc-fault circuit breaker includes a first pole assembly, a second pole assembly, a microprocessor, and a single test button. At least one of the first pole assembly and the second pole assembly has a trip mechanism. The microprocessor is electrically coupled to the first pole assembly and to the second pole assembly, and, in response to receiving a single test signal, is operative to perform electrical tests for both the first pole assembly and the second pole assembly. In response to successful completion of the electrical tests, the microprocessor is further operative to actuate the trip mechanism. The single test button is mounted to the housing and includes a single test position which causes the sending of the single test signal for initiating the electrical tests.