Singulated Electronic Component Testing With Parallel Carrier Loading
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Solution Overview
Problem
Existing semiconductor testing machines lack flexibility and efficiency in handling and testing singulated electronic components, leading to inefficiencies in the production process.
Innovation Solution
An automated test system comprising a handler with pickers and processing stations, a carrier station unit, and a test unit that allows simultaneous loading/unloading of electronic components while testing is performed, utilizing multiple carriers and pickers to optimize the testing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a single carrier is used for testing electronic components, then the testing process can be completed, but the production throughput is reduced due to sequential loading and testing operations
Solution Approach 1:
The system divides the testing process into separate segments by using multiple carriers (first carrier for loading, second carrier for testing). This allows loading operations on one carrier to occur simultaneously with testing operations on another carrier, eliminating idle time and improving throughput.
Solution Approach 2:
The system ensures continuous productive action by overlapping the loading phase (using first carrier with pickers) and the testing phase (using second carrier in test unit). While one carrier is being loaded, another is being tested, so the system never experiences idle time between operations.
2Productivity
If multiple carriers are used for simultaneous loading and testing, then production throughput is improved, but the device complexity increases
Solution Approach 1:
The handler and pickers are designed as universal components that can work with multiple carriers interchangeably. The same pickers that load the first carrier can also load the second carrier, and the test unit can process any carrier, reducing the need for specialized equipment for each carrier and managing complexity through standardization.
Solution Approach 2:
The carrier station unit acts as an intermediary that manages the coordination between multiple carriers, the handler, and the test unit. It provides a centralized control point for carrier positioning, exchange, and status management, simplifying the overall system architecture despite the presence of multiple carriers.
Data Source
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AI summary
An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.