SIP Module Circuit Pattern Embedding in Encapsulant

Solution Overview

Problem

Semiconductor devices face challenges in achieving a uniform thickness of circuit patterns, which can lead to interconnect cracking and increased package height, contradicting design goals of reduced footprint and increased functionality.

Innovation Solution

The method involves embedding a circuit pattern within the encapsulant of a system-in-package (SIP) module, using precision laser cutting and planarization to maintain a constant thickness, thereby reducing the overall height of the semiconductor package while ensuring mechanical and electrical connectivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a bottom interconnect substrate with circuit pattern is used to provide mechanical and electrical connectivity, then electrical interconnect is supported, but the overall package height increases

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

The patent merges the circuit pattern directly into the encapsulant material, combining the structural support function and electrical interconnect function into a single integrated component, eliminating the need for a separate bottom interconnect substrate and thereby reducing package height

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The encapsulant is given multiple functions: it provides mechanical protection, structural support, and electrical interconnect through the embedded circuit pattern, replacing the need for dedicated interconnect substrate layers and reducing overall package complexity and height

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If circuit pattern thickness is increased to ensure connectivity, then electrical interconnect reliability improves, but interconnect cracking occurs due to irregular thickness

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The patent replaces traditional mechanical lamination processes with laser cutting and planarization processes, enabling precise control of circuit pattern thickness and eliminating thickness irregularities that cause interconnect cracking

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the thickness parameter of the circuit pattern from irregular (causing cracking) to uniform and controlled (preventing cracking), achieving both reliable electrical interconnect and structural integrity

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for a more compact and reliable semiconductor package with a constant circuit pattern thickness, reducing assembly issues and enhancing design flexibility, while minimizing the height of the SIP module.

Implementation Method 1

precision laser cutting

Methodology Applied
Scientific EffectLaser ablation: Laser Ablation

Data Source

PatentUS11652065B2Semiconductor device and method of embedding circuit pattern in encapsulant for SIP module
Publication Date: 2023.05.16
  • US11652065B2 patent drawing
  • US11652065B2 patent drawing
  • US11652065B2 patent drawing

AI summary

An SIP module includes a plurality of electrical components mounted to an interconnect substrate. The electrical components and interconnect substrate are covered by an encapsulant. A conductive post is formed through the encapsulant. A plurality of openings is formed in the encapsulant by laser in a form of a circuit pattern. A conductive material is deposited over a surface of the encapsulant and into the openings to form an electrical circuit pattern. A portion of the conductive material is removed by a grinder to expose the electrical circuit pattern. The grinding operation planarizes the surface of the encapsulant and the electrical circuit pattern. The electrical circuit pattern can be a trace, contact pad, RDL, or other interconnect structure. The electrical circuit pattern can also be a shielding layer or antenna. An electrical component is disposed over the SIP module and electrical circuit pattern.